9781441979575 - nanoscale memory repair (integrated circuits and systems) de itoh, kiyoo; horiguchi, masashi (7 resultados)
Idioma: Inglés
Editorial: Springer 2011
Serie: Integrated Circuits and Systems, Libro 27 de 34. Libro 27 de 34 - Integrated Circuits and Systems
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Librería: thebookforest.com, San Rafael, CA, Estados Unidos de Americathebookforest.com
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EUR 115,99
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Condición: Like New. hardcover. Text block firm and clean, binding unblemished, boards straight, without highlights or underlining. Fine, like new condition. Supporting Bay Area Friends of the Library since 2010. Well packaged and promptly shipped.
Idioma: Inglés
Editorial: Springer New York 2011
Serie: Integrated Circuits and Systems, Libro 27 de 34. Libro 27 de 34 - Integrated Circuits and Systems
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Librería: Buchpark, Trebbin, AlemaniaBuchpark
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Condición: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. As a result, repair techniques have been indispensable for nano-scale me…mories. Without these techniques, even modern MPUs/ SoCs, in which memories have dominated the area and performance, could not have been designed successfully. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors' long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability. Presents the first comprehensive reference to reliability and repair techniques for nano-scale memories; Covers both the mathematical foundations and engineering applications of yield and reliability in nano-scale memories;Includes a variety of practical circuits and logic, critical for higher yield and reliability, which have been proven successful during the authors' extensive experience in developing memories and low-voltage CMOS circuits.
Idioma: Inglés
Editorial: Springer 2011
Serie: Integrated Circuits and Systems, Libro 27 de 34. Libro 27 de 34 - Integrated Circuits and Systems
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 164,52
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Condición: New. In.
Idioma: Inglés
Editorial: Springer New York 2011
Serie: Integrated Circuits and Systems, Libro 27 de 34. Libro 27 de 34 - Integrated Circuits and Systems
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 168,73
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms…of mathematics and engineering, as well as an array of repair techniques, based on the authors' long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
Idioma: Inglés
Editorial: McGraw-Hill Professional 2011
Serie: Integrated Circuits and Systems, Libro 27 de 34. Libro 27 de 34 - Integrated Circuits and Systems
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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 126,26
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Condición: new. Questo è un articolo print on demand.
Idioma: Inglés
Editorial: SPRINGER NATURE Jan 2011 2011
Serie: Integrated Circuits and Systems, Libro 27 de 34. Libro 27 de 34 - Integrated Circuits and Systems
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 160,49
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability…issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors' long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability. 218 pp. Englisch.
Idioma: Inglés
Editorial: Springer New York 2011
Serie: Integrated Circuits and Systems, Libro 27 de 34. Libro 27 de 34 - Integrated Circuits and Systems
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Librería: moluna, Greven, Alemaniamoluna
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EUR 137,26
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents the first comprehensive reference to reliability and repair techniques for nano-scale memoriesCovers both the mathematical foundations and engineering applications of yield and reliability in nano-s…cale memoriesIncludes a variety o.
