Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. As a result, repair techniques have been indispensable for nano-scale memories. Without these techniques, even modern MPUs/ SoCs, in which memories have dominated the area and performance, could not have been designed successfully.
This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
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Descripción Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors' long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability. 218 pp. Englisch. Nº de ref. del artículo: 9781441979575
Descripción Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents the first comprehensive reference to reliability and repair techniques for nano-scale memoriesCovers both the mathematical foundations and engineering applications of yield and reliability in nano-scale memoriesIncludes a variety o. Nº de ref. del artículo: 4176479
Descripción Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors' long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability. Nº de ref. del artículo: 9781441979575
Descripción Condición: New. Written from years of experience with developing memories and low-voltage CMOS circuits, Nanoscale Memory Repair describes yield and reliability issues in terms of mathematics and engineering. Readers will find a detailed explanation of the various yield models and calculations. Series: Integrated Circuits and Systems. Num Pages: 218 pages, biography. BIC Classification: TBD; TJFC. Category: (P) Professional & Vocational. Dimension: 239 x 159 x 20. Weight in Grams: 478. . 2011. Hardback. . . . . Nº de ref. del artículo: V9781441979575
Descripción Condición: New. Written from years of experience with developing memories and low-voltage CMOS circuits, Nanoscale Memory Repair describes yield and reliability issues in terms of mathematics and engineering. Readers will find a detailed explanation of the various yield models and calculations. Series: Integrated Circuits and Systems. Num Pages: 218 pages, biography. BIC Classification: TBD; TJFC. Category: (P) Professional & Vocational. Dimension: 239 x 159 x 20. Weight in Grams: 478. . 2011. Hardback. . . . . Books ship from the US and Ireland. Nº de ref. del artículo: V9781441979575