9781119076469 - modern characterization of electromagnetic systems and its associated metrology (ieee press) de sarkar, tapan k.; salazar-palma, magdalena; zhu, ming da; chen, heng (19 resultados)
- Tapa dura
Librería: INDOO, Avenel, NJ, Estados Unidos de AmericaINDOO
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 127,87
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.
Modern Characterization of Electromagnetic Systems and Its Associated Metrology
Sarkar, Tapan K.; Salazar-Palma, Magdalena; Zhu , Ming Da; Chen , Heng
- Tapa dura
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 125,55
Envío por EUR 2,28Se envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.
- Tapa dura
Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 134,40
Envío por EUR 8,00Se envía de Italia a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: new.
Modern Characterization of Electromagnetic Systems and Its Associated Metrology
Sarkar, Tapan K.; Salazar-Palma, Magdalena; Zhu , Ming Da; Chen , Heng
- Tapa dura
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 146,20
Envío por EUR 2,28Se envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: As New. Unread book in perfect condition.
- Tapa dura
Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de AmericaGrand Eagle Retail
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 159,07
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: new. Hardcover. New method for the characterization of electromagnetic wave dynamics Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques. The techniq…ues are described in terms of both principle and practice, so readers understand what they can achieve by utilizing them. Additionally, modern signal processing algorithms are introduced in order to enhance the resolution and extract information from electromagnetic systems, including where it is not currently possible. For example, the author addresses the generation of non-minimum phase or transient response when given amplitude-only data. Presents modern computational concepts in electromagnetic system characterizationDescribes a solution to the generation of non-minimum phase from amplitude-only dataCovers model-based parameter estimation and planar near-field to far-field transformation as well as spherical near-field to far-field transformation Modern Characterization of Electromagnetic Systems is ideal for graduate students, researchers, and professionals working in the area of antenna measurement and design. It introduces and explains a new process related to their work efforts and studies. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
- Tapa dura
Librería: PBShop.store UK, Fairford, GLOS, Reino UnidoPBShop.store UK
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 154,82
Envío por EUR 5,85Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 15 disponibles
HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.
Modern Characterization of Electromagnetic Systems and Its Associated Metrology
Sarkar, Tapan K.; Salazar-Palma, Magdalena; Zhu , Ming Da; Chen , Heng
- Tapa dura
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 144,96
Envío por EUR 17,48Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New.
Modern Characterization of Electromagnetic Systems and Its Associated Metrology
Sarkar, Tapan K.; Salazar-Palma, Magdalena; Zhu , Ming Da; Chen , Heng
- Tapa dura
Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Como Nuevo
EUR 153,71
Envío por EUR 17,48Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: As New. Unread book in perfect condition.
Modern Characterization of Electromagnetic Systems and its Associated Metrology
Magdalena Salazar-Palma, Ming Da Zhu, Tapan K. Sarkar, Heng Chen
- Tapa dura
Librería: Rarewaves.com USA, London, LONDO, Reino UnidoRarewaves.com USA
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 179,65
Gastos de envío gratisSe envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 17 disponibles
Hardback. Condición: New. New method for the characterization of electromagnetic wave dynamics Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques. ?The techniques are des…cribed in terms of both principle and practice, so readers understand what they can achieve by utilizing them. Additionally, modern signal processing algorithms are introduced in order to enhance the resolution and extract information from electromagnetic systems, including where it is not currently possible. For example, the author addresses the generation of non-minimum phase or transient response when given amplitude-only data. Presents modern computational concepts in electromagnetic system characterizationDescribes a solution to the generation of non-minimum phase from amplitude-only dataCovers model-based parameter estimation and planar near-field to far-field transformation as well as spherical near-field to far-field transformation Modern Characterization of Electromagnetic Systems is ideal for graduate students, researchers, and professionals working in the area of antenna measurement and design. It introduces and explains a new process related to their work efforts and studies.
- Tapa dura
Librería: THE SAINT BOOKSTORE, Southport, Reino UnidoTHE SAINT BOOKSTORE
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 160,09
Envío por EUR 20,99Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Hardback. Condición: New. New copy - Usually dispatched within 4 working days.
Modern Characterization of Electromagnetic Systems and its Associated Metrology
Sarkar, Tapan K.; Salazar-Palma, Magdalena; Zhu, Ming Da; Chen, Heng
- Tapa dura
Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 178,19
Envío por EUR 7,58Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 3 disponibles
Condición: New.
Modern Characterization of Electromagnetic Systems and its Associated Metrology (IEEE Press)
Sarkar, Tapan K.; Salazar-Palma, Magdalena; Zhu, Ming Da; Chen, Heng
- Tapa dura
Librería: Ubiquity Trade, Miami, FL, Estados Unidos de AmericaUbiquity Trade
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 185,31
Envío por EUR 2,60Se envía dentro de Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. Brand new! Please provide a physical shipping address.
- Tapa dura
- Primera edición
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 174,26
Envío por EUR 9,50Se envía de Irlanda a Estados Unidos de AmericaCantidad disponible: 15 disponibles
Condición: New. Num Pages: 400 pages. BIC Classification: TJ. Category: (P) Professional & Vocational. Weight in Grams: 666. . 2021. 1st Edition. Hardcover. . . . .
Modern Characterization of Electromagnetic Systems and its Associated Metrology
Sarkar, Tapan K.; Salazar-Palma, Magdalena; Zhu, Ming Da; Chen, Heng
- Tapa dura
Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 199,63
Envío por EUR 3,45Se envía dentro de Estados Unidos de AmericaCantidad disponible: 3 disponibles
Condición: New.
- Tapa dura
Librería: CitiRetail, Stevenage, Reino UnidoCitiRetail
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 164,44
Envío por EUR 43,12Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: new. Hardcover. New method for the characterization of electromagnetic wave dynamics Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques. The techniq…ues are described in terms of both principle and practice, so readers understand what they can achieve by utilizing them. Additionally, modern signal processing algorithms are introduced in order to enhance the resolution and extract information from electromagnetic systems, including where it is not currently possible. For example, the author addresses the generation of non-minimum phase or transient response when given amplitude-only data. Presents modern computational concepts in electromagnetic system characterizationDescribes a solution to the generation of non-minimum phase from amplitude-only dataCovers model-based parameter estimation and planar near-field to far-field transformation as well as spherical near-field to far-field transformation Modern Characterization of Electromagnetic Systems is ideal for graduate students, researchers, and professionals working in the area of antenna measurement and design. It introduces and explains a new process related to their work efforts and studies. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
- Tapa dura
Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 194,68
Envío por EUR 17,48Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Hardcover. Condición: Brand New. 692 pages. 9.00x6.25x1.25 inches. In Stock.
- Tapa dura
Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 216,39
Envío por EUR 9,09Se envía dentro de Estados Unidos de AmericaCantidad disponible: 15 disponibles
Condición: New. Num Pages: 400 pages. BIC Classification: TJ. Category: (P) Professional & Vocational. Weight in Grams: 666. . 2021. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
Modern Characterization of Electromagnetic Systems and its Associated Metrology
Magdalena Salazar-Palma, Ming Da Zhu, Tapan K. Sarkar, Heng Chen
- Tapa dura
Librería: Rarewaves.com UK, London, Reino UnidoRarewaves.com UK
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 169,44
Envío por EUR 75,75Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 17 disponibles
Hardback. Condición: New. New method for the characterization of electromagnetic wave dynamics Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques. ?The techniques are des…cribed in terms of both principle and practice, so readers understand what they can achieve by utilizing them. Additionally, modern signal processing algorithms are introduced in order to enhance the resolution and extract information from electromagnetic systems, including where it is not currently possible. For example, the author addresses the generation of non-minimum phase or transient response when given amplitude-only data. Presents modern computational concepts in electromagnetic system characterizationDescribes a solution to the generation of non-minimum phase from amplitude-only dataCovers model-based parameter estimation and planar near-field to far-field transformation as well as spherical near-field to far-field transformation Modern Characterization of Electromagnetic Systems is ideal for graduate students, researchers, and professionals working in the area of antenna measurement and design. It introduces and explains a new process related to their work efforts and studies.
- Tapa dura
Librería: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 255,01
Envío por EUR 32,01Se envía de Australia a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: new. Hardcover. New method for the characterization of electromagnetic wave dynamics Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques. The techniq…ues are described in terms of both principle and practice, so readers understand what they can achieve by utilizing them. Additionally, modern signal processing algorithms are introduced in order to enhance the resolution and extract information from electromagnetic systems, including where it is not currently possible. For example, the author addresses the generation of non-minimum phase or transient response when given amplitude-only data. Presents modern computational concepts in electromagnetic system characterizationDescribes a solution to the generation of non-minimum phase from amplitude-only dataCovers model-based parameter estimation and planar near-field to far-field transformation as well as spherical near-field to far-field transformation Modern Characterization of Electromagnetic Systems is ideal for graduate students, researchers, and professionals working in the area of antenna measurement and design. It introduces and explains a new process related to their work efforts and studies. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
