Librería: Books From California, Simi Valley, CA, Estados Unidos de America
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Añadir al carritoHardcover. Condición: Very Good.
Librería: Kadriin Blackwell, Greensville, ON, Canada
Original o primera edición
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Añadir al carritoHardcover. Condición: Fine. No Jacket. First Edition. Book.
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Añadir al carritoCondición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Librería: Basi6 International, Irving, TX, Estados Unidos de America
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Añadir al carritoCondición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
EUR 114,38
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Añadir al carritoCondición: New. pp. 352.
Librería: Romtrade Corp., STERLING HEIGHTS, MI, Estados Unidos de America
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Añadir al carritoCondición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Librería: Basi6 International, Irving, TX, Estados Unidos de America
EUR 123,58
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Añadir al carritoCondición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Añadir al carritoCondición: New. pp. 352 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.
Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 165,79
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Añadir al carritoCondición: New. In.
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Añadir al carritoGebunden. Condición: New.
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 205,24
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Añadir al carritoCondición: New. Scan statistics are used in many areas of science and technology to analyze the occurrence of observed clusters of events in time and space. This title covers such topics as: discrete scan statistics; finite Markov chain imbedding; continuous scan statistics; spatial scan statistics; and, applications in DNA sequence analysis. Series: Statistics for Industry and Technology. Num Pages: 345 pages, biography. BIC Classification: PBT; TGPQ; TGPR. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 254 x 178 x 20. Weight in Grams: 827. . 1999. Hardback. . . . .
Idioma: Inglés
Publicado por Birkhäuser, Birkhäuser, 1999
ISBN 10: 081764041X ISBN 13: 9780817640415
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 168,73
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Añadir al carritoBuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The study of scan statistics and their applications to many different scientific and engineering problems have received considerable attention in the literature recently. In addition to challenging theoretical problems, the area of scan statis tics has also found exciting applications in diverse disciplines such as archaeol ogy, astronomy, epidemiology, geography, material science, molecular biology, reconnaissance, reliability and quality control, sociology, and telecommunica tion. This will be clearly evident when one goes through this volume. In this volume, we have brought together a collection of experts working in this area of research in order to review some of the developments that have taken place over the years and also to present their new works and point out some open problems. With this in mind, we selected authors for this volume with some having theoretical interests and others being primarily concerned with applications of scan statistics. Our sincere hope is that this volume will thus provide a comprehensive survey of all the developments in this area of research and hence will serve as a valuable source as well as reference for theoreticians and applied researchers. Graduate students interested in this area will find this volume to be particularly useful as it points out many open challenging problems that they could pursue. This volume will also be appropriate for teaching a graduate-level special course on this topic.
EUR 260,16
Cantidad disponible: 15 disponibles
Añadir al carritoCondición: New. Scan statistics are used in many areas of science and technology to analyze the occurrence of observed clusters of events in time and space. This title covers such topics as: discrete scan statistics; finite Markov chain imbedding; continuous scan statistics; spatial scan statistics; and, applications in DNA sequence analysis. Series: Statistics for Industry and Technology. Num Pages: 345 pages, biography. BIC Classification: PBT; TGPQ; TGPR. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 254 x 178 x 20. Weight in Grams: 827. . 1999. Hardback. . . . . Books ship from the US and Ireland.
Idioma: Inglés
Publicado por Birkhäuser, Birkhäuser Sep 1999, 1999
ISBN 10: 081764041X ISBN 13: 9780817640415
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
EUR 160,49
Cantidad disponible: 1 disponibles
Añadir al carritoBuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The study of scan statistics and their applications to many different scientific and engineering problems have received considerable attention in the literature recently. In addition to challenging theoretical problems, the area of scan statis tics has also found exciting applications in diverse disciplines such as archaeol ogy, astronomy, epidemiology, geography, material science, molecular biology, reconnaissance, reliability and quality control, sociology, and telecommunica tion. This will be clearly evident when one goes through this volume. In this volume, we have brought together a collection of experts working in this area of research in order to review some of the developments that have taken place over the years and also to present their new works and point out some open problems. With this in mind, we selected authors for this volume with some having theoretical interests and others being primarily concerned with applications of scan statistics. Our sincere hope is that this volume will thus provide a comprehensive survey of all the developments in this area of research and hence will serve as a valuable source as well as reference for theoreticians and applied researchers. Graduate students interested in this area will find this volume to be particularly useful as it points out many open challenging problems that they could pursue. This volume will also be appropriate for teaching a graduate-level special course on this topic.Springer Nature c/o IBS, Benzstrasse 21, 48619 Heek 352 pp. Englisch.
Idioma: Inglés
Publicado por Birkhäuser Boston Sep 1999, 1999
ISBN 10: 081764041X ISBN 13: 9780817640415
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 203,29
Cantidad disponible: 2 disponibles
Añadir al carritoBuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The study of scan statistics and their applications to many different scientific and engineering problems have received considerable attention in the literature recently. In addition to challenging theoretical problems, the area of scan statis tics has also found exciting applications in diverse disciplines such as archaeol ogy, astronomy, epidemiology, geography, material science, molecular biology, reconnaissance, reliability and quality control, sociology, and telecommunica tion. This will be clearly evident when one goes through this volume. In this volume, we have brought together a collection of experts working in this area of research in order to review some of the developments that have taken place over the years and also to present their new works and point out some open problems. With this in mind, we selected authors for this volume with some having theoretical interests and others being primarily concerned with applications of scan statistics. Our sincere hope is that this volume will thus provide a comprehensive survey of all the developments in this area of research and hence will serve as a valuable source as well as reference for theoreticians and applied researchers. Graduate students interested in this area will find this volume to be particularly useful as it points out many open challenging problems that they could pursue. This volume will also be appropriate for teaching a graduate-level special course on this topic. 356 pp. Englisch.