Isbn: 9780521017954 - reflection electron microscopy and spectotrophy for surface analysis (18 resultados)

Paperback. Condición: Wie neu. Revised ed. 460 S.; Ill. Like new. Shrink wrapped. Sprache: Englisch Gewicht in Gramm: 845.

Condición: New.

Condición: New.

Paperback. Condición: New.

Condición: New.

Condición: New. A self-contained book on electron microscopy and spectrometry techniques for surface studies. Num Pages: 460 pages, 224 b/w illus. 10 tables. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 24. Weight in Grams: 730. . 2008. Revised ed. paperback. . . . . …

Condición: New. In English.

Condición: New. A self-contained book on electron microscopy and spectrometry techniques for surface studies. Num Pages: 460 pages, 224 b/w illus. 10 tables. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 24. Weight in Grams: 730. . 2008. Revised ed. paperback. . . . . Books ship from the US and Ireland. …

Condición: As New. Unread book in perfect condition.

paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

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Condición: New. Print on Demand pp. 460 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.

Condición: New. Print on Demand pp. 460.

Condición: New. PRINT ON DEMAND pp. 460.

Paperback / softback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

Paperback. Condición: new. Paperback. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applicat. …

Taschenbuch. Condición: Neu. Reflection Electron Microscopy and Spectroscopy for Surface Analysis | Zhong Lin Wang (u. a.) | Taschenbuch | Kartoniert / Broschiert | Englisch | 2005 | Cambridge University Press | EAN 9780521017954 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.…