Librería: ThriftBooks-Atlanta, AUSTELL, GA, Estados Unidos de America
EUR 11,43
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Añadir al carritoHardcover. Condición: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.
Librería: SatelliteBooks, Burlington, VT, Estados Unidos de America
EUR 26,29
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Añadir al carritohardcover. Condición: Hardcover. Hardcover. New, unused. Free of any markings and no writings inside.
Librería: Better World Books Ltd, Dunfermline, Reino Unido
EUR 26,47
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Añadir al carritoCondición: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
EUR 27,57
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Añadir al carritoCondición: Sehr gut. Zustand: Sehr gut | Seiten: 633 | Sprache: Englisch | Produktart: Bücher | The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 227,55
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Añadir al carritoCondición: New.
Librería: California Books, Miami, FL, Estados Unidos de America
EUR 229,89
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Añadir al carritoCondición: New.
Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 224,84
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Añadir al carritoCondición: New. In.
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 224,83
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Añadir al carritoCondición: New.
Idioma: Inglés
Publicado por Kluwer Academic Publishers Group, 1992
ISBN 10: 0442004710 ISBN 13: 9780442004712
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 256,93
Cantidad disponible: 15 disponibles
Añadir al carritoCondición: New. A handbook to achieving higher manufacturing yields and greater product reliability. It demonstrates how to put a cap on skyrocketing manufacturing costs. It reveals ways to pinpoint and correct the defects that reduce overall manufacturing yield. Num Pages: 633 pages, biography. BIC Classification: TD; TJF. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 254 x 178 x 36. Weight in Grams: 1372. . 1992. Hardback. . . . .
Librería: Books Puddle, New York, NY, Estados Unidos de America
EUR 281,79
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Añadir al carritoCondición: New. pp. 672.
EUR 225,03
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Añadir al carritoBuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.
EUR 246,21
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Añadir al carritoGebunden. Condición: New.
Idioma: Inglés
Publicado por Kluwer Academic Publishers Group, 1992
ISBN 10: 0442004710 ISBN 13: 9780442004712
Librería: Kennys Bookstore, Olney, MD, Estados Unidos de America
EUR 320,05
Cantidad disponible: 15 disponibles
Añadir al carritoCondición: New. A handbook to achieving higher manufacturing yields and greater product reliability. It demonstrates how to put a cap on skyrocketing manufacturing costs. It reveals ways to pinpoint and correct the defects that reduce overall manufacturing yield. Num Pages: 633 pages, biography. BIC Classification: TD; TJF. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 254 x 178 x 36. Weight in Grams: 1372. . 1992. Hardback. . . . . Books ship from the US and Ireland.
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 311,61
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Librería: Mispah books, Redhill, SURRE, Reino Unido
EUR 302,10
Cantidad disponible: 1 disponibles
Añadir al carritoHardcover. Condición: Like New. Like New. book.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 338,56
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Idioma: Inglés
Publicado por SPRINGER NATURE Nov 1992, 1992
ISBN 10: 0442004710 ISBN 13: 9780442004712
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 213,99
Cantidad disponible: 2 disponibles
Añadir al carritoBuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world. 633 pp. Englisch.
Librería: Majestic Books, Hounslow, Reino Unido
EUR 294,51
Cantidad disponible: 4 disponibles
Añadir al carritoCondición: New. Print on Demand pp. 672 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.
Librería: Biblios, Frankfurt am main, HESSE, Alemania
EUR 298,50
Cantidad disponible: 4 disponibles
Añadir al carritoCondición: New. PRINT ON DEMAND pp. 672.