Isbn: 9780306450457 - advances in x-ray analysis: volume 38 (5 resultados)

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  • Idioma: Inglés

    Editorial: Plenum, 1995

    0306450453 / 9780306450457

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    Librería: Zubal-Books, Since 1961, Cleveland, OH, Estados Unidos de AmericaZubal-Books, Since 1961

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    Condición: Usado - Bueno

    EUR 147,11

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    Cantidad disponible: 1 disponible

    Condición: Very Good. 813 pp., hardcover, minor library markings else text clean & binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.…

  • Idioma: Inglés

    Editorial: Springer, 1995

    0306450453 / 9780306450457

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    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

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    Condición: Nuevo

    EUR 348,07

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    Cantidad disponible: Más de 20 disponibles

    Condición: New. In English.

  • Idioma: Inglés

    Editorial: Springer US, 1995

    0306450453 / 9780306450457

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    Librería: moluna, Greven, Alemaniamoluna

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    Condición: Nuevo

    EUR 339,25

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    Gebunden. Condición: New. The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950 s into an international forum f.

  • Idioma: Inglés

    Editorial: Springer Us Sep 1995, 1995

    0306450453 / 9780306450457

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    Condición: Nuevo

    EUR 428,02

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    Buch. Condición: Neu. Neuware - The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950's into an international forum for the interaction of scientists, engineers and technologists interested in the use of x-rays in materials characterization. It has not only acted as a venue but has both stimulated and nurtured many of the principal developments in this field over the years. The major changes that have been occurring on the national and international scene as a result of the end of the cold war have dramatic-ally affected the way the materials community does business. The removal of defense priorities and development funds from most new materials initiatives has stimulated the char acterization communities to look to increasing the speed of their methods. This is being accom plished via the development of very fast dynamic characterization procedures which can rapidly and intelligently monitor and optimize the formation of a desired microstructure. The develop ment of intelligent characterization procedures applied in real-time during the manufacturing process can lead to the ability to design desired microstructures. Another potential advantage to this approach is its ability to characterize the actual amount of material which goes into a final product; permitting a rapid transition from R&D to manufacturing by avoiding the prob lems associated with scale-up.…

  • Condición: Nuevo

    EUR 475,43

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    Hardcover. Condición: Brand New. 787 pages. 10.25x7.00x1.75 inches. In Stock.