Idioma: Inglés
Publicado por The Institution of Engineering and Technology, 2019
ISBN 10: 1785612158 ISBN 13: 9781785612152
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 119,30
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Añadir al carritoCondición: New.
Idioma: Inglés
Publicado por The Institution of Engineering and Technology, 2019
ISBN 10: 1785612158 ISBN 13: 9781785612152
Librería: Books Puddle, New York, NY, Estados Unidos de America
EUR 118,11
Cantidad disponible: 1 disponibles
Añadir al carritoCondición: New.
Idioma: Inglés
Publicado por The Institution of Engineering and Technology, 2019
ISBN 10: 1785612158 ISBN 13: 9781785612152
Librería: Majestic Books, Hounslow, Reino Unido
EUR 120,58
Cantidad disponible: 1 disponibles
Añadir al carritoCondición: New.
Idioma: Inglés
Publicado por Institution of Engineering and Technology, GB, 2019
ISBN 10: 1785612158 ISBN 13: 9781785612152
Librería: Rarewaves USA, OSWEGO, IL, Estados Unidos de America
EUR 129,51
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Añadir al carritoHardback. Condición: New. Non-destructive testing (NDT) analysis techniques are used in science, technology and medicine to evaluate the properties of a material, component or system, without causing damage or altering the article being inspected. It is a highly valuable technique that can save money and time in product evaluation, troubleshooting, and research. Well known and widely used in industrial applications since the 60s, the NDT market is developing and growing fast. This book focuses on electromagnetic NDT methods and more specifically on the motion induced eddy current testing and evaluation (MIECTE) techniques used for conductive materials via electromagnetic methods, focusing on the Lorentz force eddy current testing (LET) method which was introduced recently. The authors present the modelling and simulation of LET systems as well as the optimal design of the measurement setups. They also show the wide variety of applications of the LET method including defect identification and sigmometry to estimate electrical conductivity of the tested material.
Idioma: Inglés
Publicado por The Institution of Engineering and Technology, 2019
ISBN 10: 1785612158 ISBN 13: 9781785612152
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 139,67
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Idioma: Inglés
Publicado por The Institution of Engineering and Technology, 2019
ISBN 10: 1785612158 ISBN 13: 9781785612152
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 128,61
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Añadir al carritoCondición: New.
Idioma: Inglés
Publicado por The Institution of Engineering and Technology, 2019
ISBN 10: 1785612158 ISBN 13: 9781785612152
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 147,93
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Idioma: Inglés
Publicado por The Institution of Engineering and Technology, 2019
ISBN 10: 1785612158 ISBN 13: 9781785612152
Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 152,21
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Añadir al carritoCondición: New. In.
Idioma: Inglés
Publicado por Institution of Engineering and Technology, GB, 2019
ISBN 10: 1785612158 ISBN 13: 9781785612152
Librería: Rarewaves USA United, OSWEGO, IL, Estados Unidos de America
EUR 133,06
Cantidad disponible: Más de 20 disponibles
Añadir al carritoHardback. Condición: New. Non-destructive testing (NDT) analysis techniques are used in science, technology and medicine to evaluate the properties of a material, component or system, without causing damage or altering the article being inspected. It is a highly valuable technique that can save money and time in product evaluation, troubleshooting, and research. Well known and widely used in industrial applications since the 60s, the NDT market is developing and growing fast. This book focuses on electromagnetic NDT methods and more specifically on the motion induced eddy current testing and evaluation (MIECTE) techniques used for conductive materials via electromagnetic methods, focusing on the Lorentz force eddy current testing (LET) method which was introduced recently. The authors present the modelling and simulation of LET systems as well as the optimal design of the measurement setups. They also show the wide variety of applications of the LET method including defect identification and sigmometry to estimate electrical conductivity of the tested material.
Idioma: Inglés
Publicado por Inst of Engineering & Technology, 2019
ISBN 10: 1785612158 ISBN 13: 9781785612152
Librería: Revaluation Books, Exeter, Reino Unido
EUR 175,76
Cantidad disponible: 1 disponibles
Añadir al carritoHardcover. Condición: Brand New. 342 pages. 9.25x6.25x0.75 inches. In Stock.
Idioma: Inglés
Publicado por Institution of Engineering and Technology, 2019
ISBN 10: 1785612158 ISBN 13: 9781785612152
Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de America
EUR 160,96
Cantidad disponible: Más de 20 disponibles
Añadir al carritoHRD. Condición: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.