Thadikaran paul (22 resultados)
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- Primera edición
Librería: Yes Books, portland, ME, Estados Unidos de AmericaYes Books
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EUR 88,86
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Hardcover. Condición: Near Fine. No Dust Jacket. 1st Edition. Spine lightly sunned. Otherwise copy is clean and unmarked in near fine condition. 322 pages.
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 118,70
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Condición: As New. Unread book in perfect condition.
Idioma: Inglés
Editorial: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 25 de 40. Libro 25 de 40 - Frontiers in Electronic Testing
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 122,51
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Condición: As New. Unread book in perfect condition.
Idioma: Inglés
Editorial: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 25 de 40. Libro 25 de 40 - Frontiers in Electronic Testing
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 115,49
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Condición: New. In.
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 115,49
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Condición: New. In.
Idioma: Inglés
Editorial: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 25 de 40. Libro 25 de 40 - Frontiers in Electronic Testing
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 130,88
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Condición: New.
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 131,22
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 115,48
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 126,37
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Condición: As New. Unread book in perfect condition.
Idioma: Inglés
Editorial: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 25 de 40. Libro 25 de 40 - Frontiers in Electronic Testing
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 144,16
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Condición: New. pp. 348.
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Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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EUR 135,80
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Condición: New. Testing techniques for VLSI circuits are undergoing changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. This volume presents the findings of research in this area. Series: Frontiers in Electronic Tes…ting. Num Pages: 342 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 20. Weight in Grams: 664. . 1997. Hardback. . . . .
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Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore
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EUR 169,21
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Condición: New. Testing techniques for VLSI circuits are undergoing changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. This volume presents the findings of research in this area. Series: Frontiers in Electronic Tes…ting. Num Pages: 342 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 20. Weight in Grams: 664. . 1997. Hardback. . . . . Books ship from the US and Ireland.
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 114,36
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more in…puts, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
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Librería: Buchpark, Trebbin, , AlemaniaBuchpark
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EUR 82,57
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Condición: Gut. Zustand: Gut | Seiten: 348 | Sprache: Englisch | Produktart: Bücher | Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one… or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Idioma: Inglés
Editorial: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 25 de 40. Libro 25 de 40 - Frontiers in Electronic Testing
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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 86,24
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Condición: new. Questo è un articolo print on demand.
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 106,99
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, fo…r one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area. 348 pp. Englisch.
Idioma: Inglés
Editorial: Springer US Okt 2012 2012
Serie: Frontiers in Electronic Testing, Libro 25 de 40. Libro 25 de 40 - Frontiers in Electronic Testing
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 106,99
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs.… If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area. 348 pp. Englisch.
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Librería: moluna, Greven, , Alemaniamoluna
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EUR 92,27
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at p…rimary outputs. If, for one or more i.
Idioma: Inglés
Editorial: Springer US 2012
Serie: Frontiers in Electronic Testing, Libro 25 de 40. Libro 25 de 40 - Frontiers in Electronic Testing
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Librería: moluna, Greven, , Alemaniamoluna
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 92,27
Envío por EUR 48,99Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at p…rimary outputs. If, for one or more i.
Idioma: Inglés
Editorial: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 25 de 40. Libro 25 de 40 - Frontiers in Electronic Testing
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Librería: Majestic Books, Hounslow, , Reino UnidoMajestic Books
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EUR 149,29
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Condición: New. Print on Demand pp. 348 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Idioma: Inglés
Editorial: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 25 de 40. Libro 25 de 40 - Frontiers in Electronic Testing
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 150,11
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Condición: New. PRINT ON DEMAND pp. 348.
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
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EUR 106,99
Envío por EUR 60,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for on…e or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective.A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson.This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers.Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 348 pp. Englisch.
