Jantscher klemens (8 resultados)

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Taschenbuch. Condición: Neu. Crystal structure determination in the scanning electron microscope | Fundamental and experimental problems | Klemens Jantscher | Taschenbuch | 104 S. | Englisch | 2015 | AV Akademikerverlag | EAN 9783639464344 | Verantwortliche Person für die EU: OmniScriptum GmbH & Co. KG, Bahnhofstr. 28, 66111 Saarbrücken, info[at]akademikerverlag[dot]de | Anbieter: preigu. …

PAP. Condición: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

PAP. Condición: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Electron backscatter diffraction in a scanning electron microscope can on the one hand be used to identify different crystalline phases and on the other hand to determine the relative orientations of single crystallites - in a polycrystalline material - to each other or to a reference plane. In general this method is applied to analyze recrystallization processes, textures or grain size distributions in different materials. In this book both, basic experimental problems of the method and problems of the data analysis are studied. Additionally, the limitations of electron backscatter diffraction are fathomed analyzing different materials and questions. Using both mineral and metal particles, the influences of particle size and particle preparation on the quality of the measurements is investigated. 104 pp. Englisch.…

Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Electron backscatter diffraction in a scanning electron microscope can on the one hand be used to identify different crystalline phases and on the other hand to determine the relative orientations of single crystallites - in a polycrystalline material - to each other or to a reference plane. In general this method is applied to analyze recrystallization processes, textures or grain size distributions in different materials. In this book both, basic experimental problems of the method and problems of the data analysis are studied. Additionally, the limitations of electron backscatter diffraction are fathomed analyzing different materials and questions. Using both mineral and metal particles, the influences of particle size and particle preparation on the quality of the measurements is investigated.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Jantscher KlemensKlemens Jantscher, Dipl.-Ing.: Bachelors degree in Technical Physics at the University of Technology Graz. Masters degree in Advanced Materials Science at the University of Technology Graz. Currently working as junio.…

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Electron backscatter diffraction in a scanning electron microscope can on the one hand be used to identify different crystalline phases and on the other hand to determine the relative orientations of single crystallites - in a polycrystalline material - to each other or to a reference plane. In general this method is applied to analyze recrystallization processes, textures or grain size distributions in different materials. In this book both, basic experimental problems of the method and problems of the data analysis are studied. Additionally, the limitations of electron backscatter diffraction are fathomed analyzing different materials and questions. Using both mineral and metal particles, the influences of particle size and particle preparation on the quality of the measurements is investigated.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 104 pp. Englisch.…