Duane am ed (4 resultados)

- Tapa dura
Librería: Anybook.com, Lincoln, Reino UnidoAnybook.com
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 97,96
Envío por EUR 36,47Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780820345215.…

- Tapa dura
Librería: Anybook.com, Lincoln, Reino UnidoAnybook.com
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 97,96
Envío por EUR 36,47Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780820345215.…

Run-to-Run Control in Semiconductor Manufacturing
Boning, Duane S. Ed(s): Moyne, James; del Castillo, Enrique; Hurwitz, A.M.
- Tapa dura
- Primera edición
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 258,45
Envío por EUR 9,50Se envía de Irlanda a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: New. Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits of run-to-run control, and offers the know-how and direction for incorporating R2R control into readers' manufacturing capabilities. Editor(s): Moyne, James; del Castillo, Enrique; Hurwitz, A.M. Num Pages: 368 pages, 27 black & white tables. BIC Classification: TGP; TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 158 x 22. Weight in Grams: 630. . 2000. 1st Edition. hardcover. . . . . …

Run-to-Run Control in Semiconductor Manufacturing
Boning, Duane S. Ed(s): Moyne, James; del Castillo, Enrique; Hurwitz, A.M.
- Tapa dura
Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 323,93
Envío por EUR 9,23Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: New. Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits of run-to-run control, and offers the know-how and direction for incorporating R2R control into readers' manufacturing capabilities. Editor(s): Moyne, James; del Castillo, Enrique; Hurwitz, A.M. Num Pages: 368 pages, 27 black & white tables. BIC Classification: TGP; TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 158 x 22. Weight in Grams: 630. . 2000. 1st Edition. hardcover. . . . . Books ship from the US and Ireland. …