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  • Idioma: Inglés

    Editorial: John Wiley & Sons Apr 1989, 1989

    047184893X / 9780471848936

    • Tapa dura

    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

    Vendedor de 5 estrellas
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    Condición: Nuevo

    EUR 454,97

    Envío por EUR 42,49 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 2 disponibles

    Buch. Condición: Neu. Neuware - The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.…