C p neo (5 resultados)

Microwave Electronics: Measurement and Materials Characterization
L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, Vijay K. Varadan
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Librería: Chiron Media, Wallingford, Reino UnidoChiron Media
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 208,46
Envío por EUR 11,93Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 20 disponibles
Hardcover. Condición: New. Brand new book, sourced directly from publisher. Dispatch time is 3-4 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 230,36
Envío por EUR 7,76Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 3 disponibles
Condición: New. pp. xiii + 537 Illus.

Microwave Electronics: Measurement and Materials Characterization
Chen, L. F.; Ong, C. K.; Neo, C. P.; Varadan, V. V.; Varadan, Vijay K.
- Tapa dura
Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 229,76
Envío por EUR 17,85Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. In English.

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Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 255,05
Envío por EUR 3,56Se envía dentro de Estados Unidos de AmericaCantidad disponible: 3 disponibles
Condición: New. pp. xiii + 537.

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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 247,98
Envío por EUR 44,27Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Buch. Condición: Neu. Neuware - The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book:\* Provides a comprehensive introduction to microwave theory and microwave measurement techniques.\* Examines every aspect of microwave material properties, circuit design and applications.\* Presents materials property characterisation methods along with a discussion of the underlying theory.\* Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications.\* Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences.This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.…