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Condición: Good. Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.

Condición: Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc.

paperback. Condición: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority!

Condición: New.

Condición: New.

SC. Condición: Gut. Obr., 7s., in gutem Zustand, [SD216]., Deu 400g.

X, 233 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Sprache: Englisch.

PAP. Condición: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

Condición: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.

PAP. Condición: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

Taschenbuch. Condición: Neu. Neuware.

Condición: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Design of Systems on a Chip: Design&Test is the second of two volumes addressing the design challenges associated with new generations of the semiconductor technology. The various chapters are the compilations of tutorials presented at workshops in the recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip. In particular this second book include contributions on three different, but complementary axes: core design, computer-aided design tools and test methods. A collection of chapters deal with the heterogeneity aspect of core designs, showing the diversity of parts that may share the same substrate in a state-of-the-art system on a chip. The second part of the book discusses CAD in three different levels of design abstraction, from system level to physical design. The third part deals with test methods. The topic is addressed from different viewpoints: in terms of chip complexity, test is discussed from the core and system prospective; in terms of signal heterogeneity, the digital, mixed-signal and microsystem prospective are considered. Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technology process of semiconductor components, in terms of transistor geometry shrinking, power supply, speed, and logic density, has significantly reduced the reliability of very deep submicron integrated circuits, in face of the various internal and external sources of noise. The very popular Field Programmable Gate Arrays, customizable by SRAM cells, are a consequence of the integrated circuit evolution with millions of memory cells to implement the logic, embedded memories, routing, and more recently with embedded microprocessors cores. These re-programmable systems-on-chip platforms must be fault-tolerant to cope with present days requirements. This book discusses fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs). It starts by showing the model of the problem and the upset effects in the programmable architecture. In the sequence, it shows the main fault tolerance techniques used nowadays to protect integrated circuits against errors. A large set of methods for designing fault tolerance systems in SRAM-based FPGAs is described. Some presented techniques are based on developing a new fault-tolerant architecture with new robustness FPGA elements. Other techniques are based on protecting the high-level hardware description before the synthesis in the FPGA. The reader has the flexibility of choosing the most suitable fault-tolerance technique for its project and to compare a set of fault toleranttechniques for programmable logic applications.

Hardcover. Condición: Good. 207 pp ; photographs in black & white and in color ; 25 cm. ; green textured cloth with gold lettering and decorations ; several photographs of important hybridizers and rose growers, and several color plates of new roses for 1961, including Super Star, Daily Sketch, Mischief, Stella, Lucy Cramphorn, Sabrina, Memoriam, Dearest, Fritz Thiedemann, Lilac Cream, Miss Ireland, Orange Sensation and Pink Parfait ; numerous interesting and important articles on rose growing ; Contents : Patrons, Officers And Council -- Arrangements For 1961 -- Report Of The Council -- Balance Sheets -- Presidents And Awards -- The President's Page, By F. Royalton Kisch, M.C., President -- A Great Venture, By F. Fairbrother, M.Sc., F.R.I.C. -- Recent Research On Roses, By E. F. Allen -- The Rose Garden Of Rome, By Stelvio Coggiatti -- The Late Charles Mallerin, By André Leroy, Louis Laperrière And M. Perroud -- Looking At Roses, By Constancewheatcroft -- Rose Arrangements, By Ena Harkness -- Book Review, By F. Fairbrother, M.Sc., F.R.I.C. -- My Grandmother's Roses, By Arbel. M. Aldous -- Rose Culture In The Tropics, By Rev. P. Soares -- The Local Incidence Of Rose Disease, By A. Dick, B.Sc., M.D.,J. Clarke, Lieut.-Col. D. Pope, F. H. Morse -- Lessons From Derriaghy, By Sam McGredy -- Red Roses, By C. Walter Gregory -- The "Floiuade" At Rotterdam 1960, By A. P. C. Dickson -- Common Mistakes In Rose Growing, By R. L. Pallett -- The Yellow Roses, By Bertram Park, O.B.E., V.M.H., Mtrite Agri -- The Unorthodox Rose Grower, By F. C. H. Witchell -- By The Way, By W. J. W. Sanday -- Fifty Years Of The Rose Annual, By A. Norman -- Garden View, By J. H. Wilding -- A Modern Approach To Rose Deterioration And Disease, By Aphra P. Wilson, M.B.E., A.R.C.S. -- "Overhead Watering Prevents Black Spot?" By Roy Hay -- Whose Roses? From A Correspondent Of The Times -- Display Gardens, By Sir Harry Pilkington . -- What's In A Name? By W. C. Thom -- Special Encouragement For Amateur Hybridists, By Edgar M. Allen, C.M.G. -- Highlights In A Veteran Rose Grower's Life, By Edgar M. Allen, C.M.G. -- An Itinerant 'Frau Karl Druschki', By Mrs. F. M. Briscoe -- Roses Which Deserve Greater Recognition, By Rosemary James -- Plant Breeders' Rights, By Gordon Edwards, C.B.E. -- The Spring Competition, By A. J. Huxley -- The Great Summer Rose Show, By A. G. L. Hellyer -- The Artistic Classes, By Julia Clements -- Bristol Group's Annual Show -- Northern Rose Show, By Mr. And Mrs. Joseph C. Watson -- The Great Autumn Rose Show, By Gordon Forsyth -- The Trial Ground, By H. Edland -- Show Awards And Trial Ground Awards 1960 -- International Awards 1960 -- The Rose Analysis, By H. Edland -- Monochrome Plates -- The President -- New Headquarters Of The National Rose Society, Bone Hill, Chiswell Green, St. Albans, Hertfordshire -- Royal Lodge, Windsor -- The Municipal Rose Gardens, Rome -- The Late Charles Mallerin -- The Silver Plate And Spoons -- The Poulsen "Family" -- Alain And Michke Meilland -- "Just Don't Get Him Started Talking About His Roses" -- 'Vanity' -- Colour Plates -- Super Star -- Daily Sketch -- Mischief -- Gold Crown -- Golden Giant -- Stella -- Lucy Cramphorn -- Sabrina -- Memoriam -- Dearest -- Fritz Thiedemann -- Lilac Charm -- Miss Ireland -- Orange Sensation -- Pink Parfait ; no dustjacket ; G. Book.

Condición: New. In.

Condición: New. In.

Condición: New. pp. 244.

Taschenbuch. Condición: Neu. Design of Systems on a Chip: Design and Test | Ricardo Reis (u. a.) | Taschenbuch | x | Englisch | 2010 | Springer | EAN 9781441940896 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design of Systems on a Chip: Design&Test is the second of two volumes addressing the design challenges associated with new generations of the semiconductor technology. The various chapters are the compilations of tutorials presented at workshops in the recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip. In particular this second book include contributions on three different, but complementary axes: core design, computer-aided design tools and test methods. A collection of chapters deal with the heterogeneity aspect of core designs, showing the diversity of parts that may share the same substrate in a state-of-the-art system on a chip. The second part of the book discusses CAD in three different levels of design abstraction, from system level to physical design. The third part deals with test methods. The topic is addressed from different viewpoints: in terms of chip complexity, test is discussed from the core and system prospective; in terms of signal heterogeneity, the digital, mixed-signal and microsystem prospective are considered.Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technology process of semiconductor components, in terms of transistor geometry shrinking, power supply, speed, and logic density, has significantly reduced the reliability of very deep submicron integrated circuits, in face of the various internal and external sources of noise. The very popular Field Programmable Gate Arrays, customizable by SRAM cells, are a consequence of the integrated circuit evolution with millions of memory cells to implement the logic, embedded memories, routing, and more recently with embedded microprocessors cores. These re-programmable systems-on-chip platforms must be fault-tolerant to cope with present days requirements. This book discusses fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs). It starts by showing the model of the problem and the upset effects in the programmable architecture. In the sequence, it shows the main fault tolerance techniques used nowadays to protect integrated circuits against errors. A large set of methods for designing fault tolerance systems in SRAM-based FPGAs is described. Some presented techniques are based on developing a new fault-tolerant architecture with new robustness FPGA elements. Other techniques are based on protecting the high-level hardware description before the synthesis in the FPGA. The reader has the flexibility of choosing the most suitable fault-tolerance technique for its project and to compare a set of fault toleranttechniques for programmable logic applications.

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design of Systems on a Chip: Design&Test is the second of two volumes addressing the design challenges associated with new generations of the semiconductor technology. The various chapters are the compilations of tutorials presented at workshops in the recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip. In particular this second book include contributions on three different, but complementary axes: core design, computer-aided design tools and test methods. A collection of chapters deal with the heterogeneity aspect of core designs, showing the diversity of parts that may share the same substrate in a state-of-the-art system on a chip. The second part of the book discusses CAD in three different levels of design abstraction, from system level to physical design. The third part deals with test methods. The topic is addressed from different viewpoints: in terms of chip complexity, test is discussed from the core and system prospective; in terms of signal heterogeneity, the digital, mixed-signal and microsystem prospective are considered.Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technology process of semiconductor components, in terms of transistor geometry shrinking, power supply, speed, and logic density, has significantly reduced the reliability of very deep submicron integrated circuits, in face of the various internal and external sources of noise. The very popular Field Programmable Gate Arrays, customizable by SRAM cells, are a consequence of the integrated circuit evolution with millions of memory cells to implement the logic, embedded memories, routing, and more recently with embedded microprocessors cores. These re-programmable systems-on-chip platforms must be fault-tolerant to cope with present days requirements. This book discusses fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs). It starts by showing the model of the problem and the upset effects in the programmable architecture. In the sequence, it shows the main fault tolerance techniques used nowadays to protect integrated circuits against errors. A large set of methods for designing fault tolerance systems in SRAM-based FPGAs is described. Some presented techniques are based on developing a new fault-tolerant architecture with new robustness FPGA elements. Other techniques are based on protecting the high-level hardware description before the synthesis in the FPGA. The reader has the flexibility of choosing the most suitable fault-tolerance technique for its project and to compare a set of fault toleranttechniques for programmable logic applications.

Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Paperback. Condición: Brand New. 297 pages. 9.00x6.00x0.55 inches. In Stock.

Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condición: new. Questo è un articolo print on demand.

Condición: new. Questo è un articolo print on demand.

Paperback / softback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. The various chapters are compiled from tutorials presented at workshops in recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip. 244 pp. Englisch.

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. The various chapters are compiled from tutorials presented at workshops in recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip. 244 pp. Englisch.

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A practical and academic overview of Systems-on-ChipDesign and test aspects are high lightedRicardo Reis is a former president of the Brazilian Computer Society and former vice-president of the Brazilian Microelectronics Society. He is .

Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A practical and academic overview of Systems-on-ChipDesign and test aspects are high lightedRicardo Reis is a former president of the Brazilian Computer Society and former vice-president of the Brazilian Microelectronics Society. He is .

Buch. Condición: Neu. Design of Systems on a Chip: Design and Test | Ricardo Reis (u. a.) | Buch | x | Englisch | 2006 | Springer | EAN 9780387324999 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.