RADIATION EFFECTS & SOFT ERRORS ...(V34): 34 (Selected Topics in Electronics and Systems) - Tapa dura

R D SCHRIMPF & D M FLEETWOOD

 
9789812389404: RADIATION EFFECTS & SOFT ERRORS ...(V34): 34 (Selected Topics in Electronics and Systems)

Sinopsis

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

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Críticas

"Ron Schrimpf and Dan Fleetwood are world renowned experts in radiation effects. This book is a great resource ..."

Reseña del editor

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

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