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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications: 85 (Springer Series in Materials Science, 85) - Tapa dura
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Sinopsis
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
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Acerca del autor
10/99 "Gustav-Mie-Preis" awarded for the diploma thesis by the Faculty of Physics at Albert-Ludwigs-University Freiburg 09/99 - 05/04 PhD thesis in physics at Fraunhofer ISE and University of Konstanz: "Lifetime spectroscopy as a method of defect characterization in silicon for photovoltaic applications" (overall grade: summa cum laude) 08/95 - 01/97 Undergraduate assistant at Fraunhofer ISE in the area of solar cell characterization 12/98 - 08/99 Research assistant at Fraunhofer ISE 1. in the department of solar cells - materials - technology 2. in the department of thermal optical systems 06/04 - today Research assistant at Fraunhofer ISE
De la contraportada
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
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Lifetime Spectroscopy
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Springer Berlin Heidelberg, 2005
ISBN 10: 3540253033
ISBN 13: 9783540253037
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A convincing demonstration of a powerful characterization methodA convincing demonstration of a powerful characterization method10/99 Gustav-Mie-Preis awarded for the diploma thesis by the Faculty of Physics at Albert-Ludwigs-University . Nº de ref. del artículo: 4886442
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Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
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Lifetime Spectroscopy
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Springer Berlin Heidelberg Jun 2005, 2005
ISBN 10: 3540253033
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy. 520 pp. Englisch. Nº de ref. del artículo: 9783540253037
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science, 85)
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Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy. Nº de ref. del artículo: 9783540253037
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Lifetime Spectroscopy
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Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2005, 2005
ISBN 10: 3540253033
ISBN 13: 9783540253037
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Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 520 pp. Englisch. Nº de ref. del artículo: 9783540253037
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science)
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science)
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Hardcover. Condición: Brand New. 1st edition. 489 pages. German language. 9.25x6.50x0.75 inches. In Stock. Nº de ref. del artículo: x-3540253033
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science, 85)
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hardcover. Condición: New. In shrink wrap. Looks like an interesting title! Nº de ref. del artículo: Q-3540253033
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