Artículos relacionados a Lifetime Spectroscopy: A Method of Defect Characterization...
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications: 85 (Springer Series in Materials Science) - Tapa dura
Sinopsis
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
"Sinopsis" puede pertenecer a otra edición de este libro.
Acerca del autor
10/99 "Gustav-Mie-Preis" awarded for the diploma thesis by the Faculty of Physics at Albert-Ludwigs-University Freiburg
09/99 – 05/04 PhD thesis in physics at Fraunhofer ISE and University of Konstanz:
"Lifetime spectroscopy as a method of defect characterization in silicon for photovoltaic applications" (overall grade: summa cum laude)
08/95 – 01/97 Undergraduate assistant at Fraunhofer ISE in the area of solar cell
characterization
12/98 – 08/99 Research assistant at Fraunhofer ISE
1. in the department of solar cells – materials – technology
2. in the department of thermal optical systems
06/04 – today Research assistant at Fraunhofer ISE
De la contraportada
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
"Sobre este título" puede pertenecer a otra edición de este libro.
Comprar nuevo
Ver este artículo
EUR 48,86
EUR 10,23 gastos de envío desde Reino Unido a España
Destinos, gastos y plazos de envíoOtras ediciones populares con el mismo título
Resultados de la búsqueda para Lifetime Spectroscopy: A Method of Defect Characterization...
Imagen de archivo
Lifetime Spectroscopy
Librería: Majestic Books, Hounslow, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. pp. xxvi + 489. Nº de ref. del artículo: 7535194
Cantidad disponible: 1 disponibles
Imagen de archivo
Lifetime Spectroscopy
Librería: Books Puddle, New York, NY, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: New. pp. xxvi + 489 1st Edition. Nº de ref. del artículo: 26345477
Cantidad disponible: 1 disponibles
Imagen de archivo
Lifetime Spectroscopy
Librería: Biblios, Frankfurt am main, HESSE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. pp. xxvi + 489. Nº de ref. del artículo: 18345487
Cantidad disponible: 1 disponibles
Imagen de archivo
Lifetime Spectroscopy : A Method Of Defect Characterization In Silicon For Photovoltaic Applications (springer Series In Materials Science)
Librería: Romtrade Corp., STERLING HEIGHTS, MI, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Nº de ref. del artículo: ABNR-157111
Cantidad disponible: 1 disponibles
Imagen de archivo
Lifetime Spectroscopy : A Method Of Defect Characterization In Silicon For Photovoltaic Applications (springer Series In Materials Science)
Librería: Basi6 International, Irving, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Nº de ref. del artículo: ABEJUNE24-342122
Cantidad disponible: 1 disponibles
Imagen del vendedor
Lifetime Spectroscopy
Publicado por
Springer Berlin Heidelberg, 2005
ISBN 10: 3540253033
ISBN 13: 9783540253037
Nuevo
Tapa dura
Librería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A convincing demonstration of a powerful characterization methodA convincing demonstration of a powerful characterization method10/99 Gustav-Mie-Preis awarded for the diploma thesis by the Faculty of Physics at Albert-Ludwigs-University . Nº de ref. del artículo: 4886442
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science, 85)
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. In English. Nº de ref. del artículo: ria9783540253037_new
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Lifetime Spectroscopy
Publicado por
Springer Berlin Heidelberg Jun 2005, 2005
ISBN 10: 3540253033
ISBN 13: 9783540253037
Nuevo
Tapa dura
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy. 520 pp. Englisch. Nº de ref. del artículo: 9783540253037
Cantidad disponible: 2 disponibles
Imagen del vendedor
Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
Publicado por
Springer Berlin Heidelberg, 2005
ISBN 10: 3540253033
ISBN 13: 9783540253037
Nuevo
Tapa dura
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy. Nº de ref. del artículo: 9783540253037
Cantidad disponible: 1 disponibles
Imagen del vendedor
Lifetime Spectroscopy
Publicado por
Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2005, 2005
ISBN 10: 3540253033
ISBN 13: 9783540253037
Nuevo
Tapa dura
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Neuware -Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 520 pp. Englisch. Nº de ref. del artículo: 9783540253037
Cantidad disponible: 2 disponibles