Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons: 209 (Springer Tracts in Modern Physics, 209) - Tapa dura
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The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.
A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
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The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.
A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
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Infrared Ellipsometry on Semiconductor Layer Structures. Phonons, Plasmons, and Polaritons.
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Berlin, Springer., 2004
ISBN 10: 3540232494
ISBN 13: 9783540232490
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77 figs., XI, 193 p. Hardcover Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Springer Tracts in Modern Physics, Vol. 209. Sprache: Englisch. Nº de ref. del artículo: 3908AB
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Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics, 209)
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Infrared Ellipsometry on Semiconductor Layer Structures
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Springer Berlin Heidelberg, 2004
ISBN 10: 3540232494
ISBN 13: 9783540232490
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Condición: New. Describes a powerful new method for investigating semiconductor layer structuresAuthor is a leading expert in the fieldThe study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spe. Nº de ref. del artículo: 4885851
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Infrared Ellipsometry on Semiconductor Layer Structures : Phonons, Plasmons, and Polaritons
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Springer, Berlin, Springer, 2004
ISBN 10: 3540232494
ISBN 13: 9783540232490
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Buch. Condición: Neu. Neuware - The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed. Nº de ref. del artículo: 9783540232490
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