9783540232490 - Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons: 209 (Springer Tracts in Modern Physics, 209) de Schubert, Mathias (4 resultados)

77 figs., XI, 193 p. Hardcover Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Springer Tracts in Modern Physics, Vol. 209. Sprache: Englisch.

Condición: New. In.

Condición: New. Describes a powerful new method for investigating semiconductor layer structuresAuthor is a leading expert in the fieldThe study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spe.

Buch. Condición: Neu. Neuware - The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.