Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing) - Tapa blanda
Sinopsis
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
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Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
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Design for AT-Speed Test, Diagnosis and Measurement
Publicado por
Springer US Apr 2013, 2013
ISBN 10: 1475782918
ISBN 13: 9781475782912
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. 260 pp. Englisch. Nº de ref. del artículo: 9781475782912
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
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Design for AT-Speed Test, Diagnosis and Measurement
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as a. Nº de ref. del artículo: 4208106
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Design for At-Speed Test, Diagnosis and Measurement
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Condición: New. pp. 260. Nº de ref. del artículo: 2697859479
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Design for AT-Speed Test, Diagnosis and Measurement
Publicado por
Springer US, Springer New York Apr 2013, 2013
ISBN 10: 1475782918
ISBN 13: 9781475782912
Nuevo
Taschenbuch
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 260 pp. Englisch. Nº de ref. del artículo: 9781475782912
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Design for AT-Speed Test, Diagnosis and Measurement
Publicado por
Springer US, Springer New York, 2013
ISBN 10: 1475782918
ISBN 13: 9781475782912
Nuevo
Taschenbuch
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. Nº de ref. del artículo: 9781475782912
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Design for At-Speed Test, Diagnosis and Measurement
Impresión bajo demandaLibrería: Majestic Books, Hounslow, Reino Unido
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Condición: New. Print on Demand pp. 260 66:B&W 7 x 10 in or 254 x 178 mm Perfect Bound on White w/Gloss Lam. Nº de ref. del artículo: 94537800
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Design for At-Speed Test, Diagnosis and Measurement
Impresión bajo demandaLibrería: Biblios, Frankfurt am main, HESSE, Alemania
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Condición: New. PRINT ON DEMAND pp. 260. Nº de ref. del artículo: 1897859485
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Librería: Mispah books, Redhill, SURRE, Reino Unido
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Paperback. Condición: Like New. Like New. book. Nº de ref. del artículo: ERICA80014757829186
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