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Sinopsis
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
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Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
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On-Line Testing for Vlsi
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On-Line Testing for VLSI (Hardcover)
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Hardcover. Condición: new. Hardcover. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. This text contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE international on-line testing workshops. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Nº de ref. del artículo: 9780792381327
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design. Nº de ref. del artículo: 5970701
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On-line Testing for VLSI
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Kluwer Academic Publishers, 1998
ISBN 10: 0792381327
ISBN 13: 9780792381327
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Condición: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . . Nº de ref. del artículo: V9780792381327
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