Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem - Tapa dura

Egerton, R.; Egerton, Ray

 
9780387258003: Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem
Tapa dura
ISBN 10: 0387258000 ISBN 13: 9780387258003
Editorial: Springer, 2008

Sinopsis

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

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De la contraportada

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

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Editorial
Springer
Año de publicación
2008
Idioma
Inglés
ISBN 10 
0387258000
ISBN 13 
9780387258003
Encuadernación
Tapa dura
Número de edición
2
Número de páginas
216
Contacto del fabricante
no disponible
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Hamburg
Alemania

Otras ediciones populares con el mismo título

9783319819860: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Edición Destacada

ISBN 10:  3319819860 ISBN 13:  9783319819860
Editorial: Springer, 2018
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