Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem - Tapa dura

From the reviews:

"This book comprises a concise introduction to the fundamental physical concepts of electron microscopy and related analytical techniques ... . The concepts are well explained and illustrated, and in addition, the author offers a helpful introduction to microscopy, as a whole ... . The text includes interesting historical tidbits and also alludes to more recent developments ... . It is suitable for institutional or personal purchase." (Andreas Holzenburg, Microbiology Today, July, 2006)

"R.F. Egerton ... has now written a short book for beginners on electron microscopy in general: Physical Principles of Electron Microscopy, an Introduction to TEM, SEM, and AEM[10]. ... Extremely simple language is used throughout and newcomers to the subject will be grateful for this text, designed to accompany a one-semester undergraduate course." (P. W. Hawkes, Ultramicroscopy, Vol. 107 (54), 2007)

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.