This volume presents a comprehensive collection of the latest research findings supporting the current and future implementations and applications of computerized multistage testing (MST).
"Sinopsis" puede pertenecer a otra edición de este libro.
Duanli Yan is a Director of Computational Research at Educational Testing Services, Princeton, New Jersey, USA. She is also an adjunct professor at Rutgers University and Fordham University and has extensive experience in innovative psychometric research and development. She has published many books and received many awards, including the 2016 AERA D Significant Contribution to Educational Measurement and Research Methodology Award, and the 2022 and 2023 NCME Bradley Hanson Award.
Alina A. von Davier is the Chief of Assessment at Duolingo, Pittsburgh, Pennsylvania, USA. She leads the Duolingo English Test research and development area. She is a researcher in computational psychometrics, machine learning, and education. Von Davier is an innovator and an executive leader with over 20 years of experience in EdTech and in the assessment industry. In 2022, she joined the University of Oxford as an Honorary Research Fellow, and Carnegie Mellon University as a Senior Research Fellow.
David J. Weiss is a Professor of Psychology at University of Minnesota, Minnesota, USA. He has been continuously active in computerized adaptive testing (CAT) research since 1970, including hosting six international CAT conferences. He co-founded the International Association for Computerized Adaptive Testing, the Assessment Systems Corporation, and the Insurance Testing Corporation and was the founding editor of Applied Psychological Measurement and the Journal of Computerized Adaptive Testing.
"Sobre este título" puede pertenecer a otra edición de este libro.
EUR 17,18 gastos de envío desde Estados Unidos de America a España
Destinos, gastos y plazos de envíoEUR 9,25 gastos de envío desde Reino Unido a España
Destinos, gastos y plazos de envíoLibrería: Speedyhen, London, Reino Unido
Condición: NEW. Nº de ref. del artículo: NW9780367207816
Cantidad disponible: 2 disponibles
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Condición: New. Nº de ref. del artículo: V9780367207816
Cantidad disponible: 2 disponibles
Librería: THE SAINT BOOKSTORE, Southport, Reino Unido
Paperback / softback. Condición: New. New copy - Usually dispatched within 4 working days. 952. Nº de ref. del artículo: B9780367207816
Cantidad disponible: 1 disponibles
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Condición: New. In. Nº de ref. del artículo: ria9780367207816_new
Cantidad disponible: Más de 20 disponibles
Librería: Majestic Books, Hounslow, Reino Unido
Condición: New. Nº de ref. del artículo: 396145819
Cantidad disponible: 3 disponibles
Librería: Chiron Media, Wallingford, Reino Unido
paperback. Condición: New. Nº de ref. del artículo: 6666-GRD-9780367207816
Cantidad disponible: 2 disponibles
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This volume presents a comprehensive collection of the latest research findings supporting the current and future implementations and applications of computerized multistage testing (MST). Nº de ref. del artículo: 9780367207816
Cantidad disponible: 2 disponibles
Librería: Revaluation Books, Exeter, Reino Unido
Paperback. Condición: Brand New. 546 pages. 9.18x6.12x9.21 inches. In Stock. Nº de ref. del artículo: __0367207818
Cantidad disponible: 2 disponibles
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Condición: New. Nº de ref. del artículo: 47847601-n
Cantidad disponible: 2 disponibles
Librería: Kennys Bookstore, Olney, MD, Estados Unidos de America
Condición: New. Nº de ref. del artículo: V9780367207816
Cantidad disponible: 2 disponibles