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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1969 (Classic Reprint) - Tapa blanda
Sinopsis
Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1969
During this quarter no work was carried out on either the high field effects task or the deep-level studies task. Work on the former has been suspended indefinitely in order that the staff originally assigned part time to it may devote all their efforts to the wire bond evaluation task. Work on the latter will be completed before the end of this fiscal year.
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, October 1 to December 31, 1969 Classic Reprint
Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000. Nº de ref. del artículo: LW-9780365160144
Cantidad disponible: 15 disponibles
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, October 1 to December 31, 1969 Classic Reprint
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000. Nº de ref. del artículo: LW-9780365160144
Cantidad disponible: 15 disponibles
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Methods of Measurement for Semiconductor Materials, Process Control, and
Impresión bajo demandaLibrería: Forgotten Books, London, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Paperback. Condición: New. Print on Demand. This book presents an in-depth study of methods for measuring semiconductors, process control, and devices. Written by the author as an expansion of a quarterly report to project sponsors, the book covers the development of methods for improving semiconductor performance, interchangeability, and reliability. The author provides an easily applicable guide to the measurement of material properties. This book is a useful resource for engineers and researchers working with semiconductors. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Nº de ref. del artículo: 9780365160144_0
Cantidad disponible: Más de 20 disponibles