9780365160144 - methods of measurement for semiconductor materials, process control, and devices: quarterly report, october 1 to december 31, 1969 (classic reprint) de bullis, w. murray (3 resultados)
- Tapa blanda
Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de AmericaPBShop.store US
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 25,19
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 15 disponibles
PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.
- Tapa blanda
Librería: PBShop.store UK, Fairford, GLOS, Reino UnidoPBShop.store UK
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 24,84
Envío por EUR 3,84Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 15 disponibles
PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.
- Tapa blanda
- Impresión bajo demanda
Librería: Forgotten Books, London, Reino UnidoForgotten Books
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 15,83
Gastos de envío gratisSe envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Paperback. Condición: New. Print on Demand. This book presents an in-depth study of methods for measuring semiconductors, process control, and devices. Written by the author as an expansion of a quarterly report to project sponsors, the book covers the development of methods for improving semiconductor performance, interchangeab…ility, and reliability. The author provides an easily applicable guide to the measurement of material properties. This book is a useful resource for engineers and researchers working with semiconductors. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.
