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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials) - Tapa blanda
Sinopsis
Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials.
The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.
- Presents an in-depth look at the SNDM materials characterization technique by its inventor
- Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices
- Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique
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Acerca del autor
Yasuo Cho graduated in 1980 from Tohoku University in electrical engineering department. In 1985 he became a research associate at Research Institute of Electrical Communication Tohoku University. In 1990, he received an associate professorship from Yamaguchi University. He then became an associate professor in 1997 and a full professor in 2001 at Research Institute of Electrical Communication Tohoku University. During this time, his main research interests included nonlinear phenomena in ferroelectric materials and their applications, research on the scanning nonlinear dielectric microscopy (SNDM), and research on using the SNDM in next-generation ultrahigh density ferroelectric data storage (SNDM ferroelectric probe memory).
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- EditorialWoodhead Publishing
- Año de publicación2020
- ISBN 10 0128172460
- ISBN 13 9780128172469
- EncuadernaciónTapa blanda
- IdiomaInglés
- Número de páginas258
- Contacto del fabricanteno disponible
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Scanning Nonlinear Dielectric Microscopy : Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices
Publicado por
Woodhead Publishing, 2020
ISBN 10: 0128172460
ISBN 13: 9780128172469
Nuevo
Tapa blanda
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: 40957026-n
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Scanning Nonlinear Dielectric Microscopy
Publicado por
Elsevier Science & Technology, Woodhead Publishing, 2020
ISBN 10: 0128172460
ISBN 13: 9780128172469
Nuevo
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Englisch. Nº de ref. del artículo: 9780128172469
Cantidad disponible: 2 disponibles
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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials)
Publicado por
Woodhead Publishing, 2020
ISBN 10: 0128172460
ISBN 13: 9780128172469
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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices
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Paperback. Condición: Brand New. 500 pages. 9.00x6.00x0.71 inches. In Stock. Nº de ref. del artículo: __0128172460
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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices
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Elsevier Science & Technology|Woodhead Publishing, 2020
ISBN 10: 0128172460
ISBN 13: 9780128172469
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. W. Nº de ref. del artículo: 336108498
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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices
Publicado por
Woodhead Publishing, 2020
ISBN 10: 0128172460
ISBN 13: 9780128172469
Nuevo
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Scanning Nonlinear Dielectric Microscopy : Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices
Publicado por
Elsevier Science & Technology, Woodhead Publishing, 2020
ISBN 10: 0128172460
ISBN 13: 9780128172469
Nuevo
Taschenbuch
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Nº de ref. del artículo: 9780128172469
Cantidad disponible: 2 disponibles
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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials)
Publicado por
Woodhead Publishing, 2020
ISBN 10: 0128172460
ISBN 13: 9780128172469
Nuevo
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Calificación del vendedor: 4 de 5 estrellas
Condición: New. pp. 500. Nº de ref. del artículo: 26377082385
Cantidad disponible: 3 disponibles
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Scanning Nonlinear Dielectric Microscopy : Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices
Publicado por
Woodhead Publishing, 2020
ISBN 10: 0128172460
ISBN 13: 9780128172469
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: As New. Unread book in perfect condition. Nº de ref. del artículo: 40957026
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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials)
Publicado por
Woodhead Publishing, 2020
ISBN 10: 0128172460
ISBN 13: 9780128172469
Nuevo
Tapa blanda
Librería: Biblios, Frankfurt am main, HESSE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. pp. 500. Nº de ref. del artículo: 18377082395
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