VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon) - Tapa dura

Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing

 
9780123705976: VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
Tapa dura
ISBN 10: 0123705975 ISBN 13: 9780123705976
Editorial: Morgan Kaufmann Publishers In, 2006

Sinopsis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

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Acerca de los autores

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.

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Editorial
Morgan Kaufmann Publishers In
Año de publicación
2006
Idioma
Inglés
ISBN 10 
0123705975
ISBN 13 
9780123705976
Encuadernación
Tapa dura
Número de páginas
808
Contacto del fabricante
no disponible
Persona responsable
no disponible

Otras ediciones populares con el mismo título

9781493300860: VLSI Test Principles and Architectures: Design for Testability

Edición Destacada

ISBN 10:  1493300865 ISBN 13:  9781493300860
Editorial: Morgan Kaufmann, 2014
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