Librería:
Book Bear, West Brookfield, MA, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Vendedor de AbeBooks desde 10 de enero de 2007
412 pp. Tightly bound. Corners not bumped. Text is free of markings. No ownership markings. No dust jacket. Please Note: The reason for the lower "good" rating is because there is foxing to the top and side fore-edges. First Edition / First Printing. 1,3,5,7,9,8,6,4,2. This copy is smyth sewn. Smyth sewing is a method of bookbinding where groups of folded pages (referred to as signatures) are stitched together using binder thread. Each folded signature is sewn together individually with multiple stitches and then joined with other signatures to create the complete book block. This is the traditional and best method of bookbinding. N° de ref. del artículo 031235
Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
Reseña del editor: Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
Título: Introduction to Scanning Tunneling Microscopy
Editorial: Oxford University Press, New York, NY
Año de publicación: 1993
Encuadernación: Hardcover
Condición: Good
Condición de la sobrecubierta: No Dust Jacket
Edición: 1st Edition
Librería: Book House in Dinkytown, IOBA, Minneapolis, MN, Estados Unidos de America
Hardcover. Condición: Near Fine. First Edition. 1st printing with complete number line. Very good+/near fine hardcover, from a private home collection. Interior appears free of markings. Binding is tight, sturdy, and square. No dust jacket issued. Exterior looks great. Ships same or next business day from Dinkytown in Minneapolis, Minnesota. Due to the size/weight of this book extra charges may apply for international shipping. Nº de ref. del artículo: 325820
Cantidad disponible: 1 disponibles