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Materials processing using plasma de hassan muhammad (2 resultados)

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  • Idioma: Inglés

    Editorial: VDM Verlag Dr. Müller, 2010

    3639276639 / 9783639276633

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    Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books

    Vendedor de 4 estrellas
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    Condición: Usado - Como Nuevo

    EUR 182,06

    Envío por EUR 29,86 
    Se envía de Reino Unido a Estados Unidos de America

    Cantidad disponible: 1 disponible

    Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Idioma: Inglés

    Editorial: VDM Verlag Dr. Müller, 2010

    3639276639 / 9783639276633

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    • Impresión bajo demanda

    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

    Vendedor de 5 estrellas
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    Condición: Nuevo

    EUR 75,49

    Envío por EUR 35,00 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 2 disponibles

    Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The present research work reports the parametric study of ion beams emitted from two different Mather type plasma focus devices and their utilization in materials processing. Experiments have been conducted by using a conventional 2.3 kJ UNU/ICTP plasma focus device and the NX2 device (a repetitive plasma focus). The ion parameters such as energy, energy distribution, number density and current density are evaluated in the ambient gas pressure by employing a BPX65 photodiode and a Faraday cup (FC) using time of flight technique. A major motivation is to establish the optimum processing conditions for ion nitriding, surface modification, phase changes and carburizing of materials of industrial interest like Ti, AlFe1.8Zn0.8 alloy and SS-321 in plasma environment. The processed samples are characterized for structural and morphological changes, compositional profile and surface hardness by employing XRD, SEM FESEM, EDX, XPS, Raman spectroscopy and Vickers microhardness test. The SRIM code and microindentation measurements are used to estimate the depth profile of the modified layers.…