Publicado por International Union of Crystallography, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: Better World Books Ltd, Dunfermline, Reino Unido
EUR 202,39
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Publicado por OXFORD UNIVERSITY PRESS, 2005
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: UK BOOKS STORE, London, LONDO, Reino Unido
EUR 211,15
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Publicado por OXFORD UNIVERSITY PRESS, 2005
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: URW Books Store, CASPER, WY, Estados Unidos de America
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Publicado por Oxford University Press, Oxford, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: AussieBookSeller, Truganina, VIC, Australia
EUR 221,65
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Añadir al carritoHardcover. Condición: new. Hardcover. Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured.In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the realstructure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book providesa comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays thefoundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in aspecimen. This book provides a complete summary of the developments of the twentieth century and points the way. This book reviews the state of the art for determining the "real" structure of matter. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Publicado por International Union of Crystallo, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: HPB-Red, Dallas, TX, Estados Unidos de America
EUR 224,81
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Publicado por International Union of Crystallography, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 361,68
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Publicado por International Union of Crystallography, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 361,67
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Publicado por International Union of Crystallography, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 368,34
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Publicado por Oxford University Press, Oxford, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: CitiRetail, Stevenage, Reino Unido
EUR 377,96
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Añadir al carritoHardcover. Condición: new. Hardcover. Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured.In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the realstructure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book providesa comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays thefoundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in aspecimen. This book provides a complete summary of the developments of the twentieth century and points the way. This book reviews the state of the art for determining the "real" structure of matter. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
Publicado por International Union of Crystallography, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 393,20
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Publicado por International Union of Crystallography, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 398,52
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Publicado por Oxford University Press (UK) Mär 2000, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 479,31
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Añadir al carritoBuch. Condición: Neu. Neuware - Defect and Microstructure Analysis by Diffraction looks at a key aspect of state-of-the-art methods for analyzing the actual structure of materials. Diffraction analysis is typically based on idealized crystals. The impurities and irregularities that work themselves into virtually all crystalstructures, however, cause diffraction peak profiles to broaden and sometimes become asymmetric, making the data difficult to interpret. More powerful methods are undoing this effect, using the discrepancies themselves to describe microstructure of the material with unprecedented accuracy. Thesetechniques in turn play a key role in many of the evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis. This book provides a comprehensive analysis of the fundamental theory and techniquesfor microstructure analysis from diffraction patterns and summarizes the current state of the art. It lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal ofthis research is to extract all of the information locked in the powder diffraction pattern including the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in aspecimen.
Publicado por Oxford University Press, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: OM Books, Sevilla, SE, España
EUR 499,00
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Publicado por International Union of Crystallography, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: BennettBooksLtd, North Las Vegas, NV, Estados Unidos de America
EUR 703,66
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Añadir al carritoHardcover. Condición: New. In shrink wrap. Looks like an interesting title!
Publicado por Intl Union of Crystallography, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
EUR 363,91
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Publicado por Intl Union of Crystallography, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de America
EUR 376,19
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Publicado por International Union of Crystallography, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 399,92
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Publicado por Oxford University Press, Oxford, 2000
ISBN 10: 0198501897 ISBN 13: 9780198501893
Idioma: Inglés
Librería: Grand Eagle Retail, Mason, OH, Estados Unidos de America
EUR 500,70
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Añadir al carritoHardcover. Condición: new. Hardcover. Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured.In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the realstructure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book providesa comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays thefoundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in aspecimen. This book provides a complete summary of the developments of the twentieth century and points the way. This book reviews the state of the art for determining the "real" structure of matter. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.