ISBN: 9787111749622 - 图解入门 半导体器件缺陷与失效分析技术精讲 山本秀和 半导体 芯片 集成电路 半导体制造 半导体器件 机工社【金辉荣丰图书】 (1 resultados)

paperback. Condición: New. Language:Chinese.Paperback. Pub Date: 2024-03 Pages: 168 Publisher: China Machinery Press This book is divided into 4 chapters. including an overview of semiconductor device defects and failure analysis technology. failure analysis technology of silicon integrated circuits (li). defects and failure analysis technology of power devices. and defects and failure analysis technology of compound semiconductor light-emitting devices. The author has opened columns in various places in the book to in.…