Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing, 2023
ISBN 10: 6206844730 ISBN 13: 9786206844730
Librería: preigu, Osnabrück, Alemania
EUR 52,45
Cantidad disponible: 5 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. SRAM Design in Nanometer Technologies | Low Voltage SRAM Circuit Techniques | Pulla Reddy A (u. a.) | Taschenbuch | Englisch | 2023 | LAP LAMBERT Academic Publishing | EAN 9786206844730 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.
Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing Nov 2023, 2023
ISBN 10: 6206844730 ISBN 13: 9786206844730
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 60,90
Cantidad disponible: 2 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware 120 pp. Englisch.
Idioma: Inglés
Publicado por LAP Lambert Academic Publishing, 2023
ISBN 10: 6206844730 ISBN 13: 9786206844730
Librería: moluna, Greven, Alemania
EUR 49,92
Cantidad disponible: Más de 20 disponibles
Añadir al carritoCondición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In the design of VLSI, where an improvement in minimum supply voltage and a change in few Pico seconds of memory access or cycle times will make a big impact on SoC designs performance. SRAM cell write-ability and read stability are of prime concern at low .
Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing Nov 2023, 2023
ISBN 10: 6206844730 ISBN 13: 9786206844730
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
EUR 60,90
Cantidad disponible: 1 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -In the design of VLSI, where an improvement in minimum supply voltage and a change in few Pico seconds of memory access or cycle times will make a big impact on SoC designs performance. SRAM cell write-ability and read stability are of prime concern at low supply voltages and also for process, voltage and temperature variations. When low supply voltage is applied to SRAM cell, the write operation will not be performed because the cell will not flip to desired voltage levels. A write assist circuit using a negative bitline voltage technique which can assist SRAM cell to flip to the desired voltage levels and assists the write operation is proposed for reducing write failures at low supply voltages.When low supply voltage applied to SRAM cell the read operation will not be performed in the selected cell and the cell stored data will be disturbed in the unselected cells. The proposed lowered WL voltage read assist circuit technique prevents the data from getting disturbed in unselected cells and also assists the read operation in selected cell.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 120 pp. Englisch.
Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing, 2023
ISBN 10: 6206844730 ISBN 13: 9786206844730
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 61,63
Cantidad disponible: 1 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - In the design of VLSI, where an improvement in minimum supply voltage and a change in few Pico seconds of memory access or cycle times will make a big impact on SoC designs performance. SRAM cell write-ability and read stability are of prime concern at low supply voltages and also for process, voltage and temperature variations. When low supply voltage is applied to SRAM cell, the write operation will not be performed because the cell will not flip to desired voltage levels. A write assist circuit using a negative bitline voltage technique which can assist SRAM cell to flip to the desired voltage levels and assists the write operation is proposed for reducing write failures at low supply voltages.When low supply voltage applied to SRAM cell the read operation will not be performed in the selected cell and the cell stored data will be disturbed in the unselected cells. The proposed lowered WL voltage read assist circuit technique prevents the data from getting disturbed in unselected cells and also assists the read operation in selected cell.