ISBN: 9783844391886 - statistical methods and profile fitting functions in powder xrd: voigt and pseudo-voigt functions (11 resultados)

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Taschenbuch. Condición: Neu. Statistical methods and profile fitting functions in powder XRD | Voigt and Pseudo-Voigt functions | Prabal Dasgupta | Taschenbuch | 164 S. | Englisch | 2011 | LAP LAMBERT Academic Publishing | EAN 9783844391886 | Verantwortliche Person für die EU: OmniScriptum GmbH & Co. KG, Bahnhofstr. 28, 66111 Saarbrücken, info[at]akademikerverlag[dot]de | Anbieter: preigu. …

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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This work deals maily with following areas of XRD line profile analysis: In chapter II methods of precise and accurate estimation of crystallographic parameters using statistical techniques such as maximum likelyhood method & Min-Max method, have been developed and applied to extract different crystallographic parameters. In Chapter III methods were developed to ascertain which analytical function can describe an experimentally observed XRD peak best. In chapter IV short-commings of Voigt & pseudo- Voigt functions when subjected to Warren Averbach and variance method of size-strain analysis ,were discussed. In Chapter V a new method of structure refinement - an alternative to the rietveld method, was proposed and applied to powder data of tungsten oxide .This method requires no apriori assumption regarding the functional nature of observed peaks . 164 pp. Englisch.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Dasgupta PrabalDr. Prabal Dasgupta is working in the field of material science for last twenty years.He is M.Sc. in physical chemistry and PhD in material science, both from Jadavpur University,India.Many of his papers were puplis.…

Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This work deals maily with following areas of XRD line profile analysis: In chapter II methods of precise and accurate estimation of crystallographic parameters using statistical techniques such as maximum likelyhood method & Min-Max method, have been developed and applied to extract different crystallographic parameters. In Chapter III methods were developed to ascertain which analytical function can describe an experimentally observed XRD peak best. In chapter IV short-commings of Voigt & pseudo- Voigt functions when subjected to Warren Averbach and variance method of size-strain analysis ,were discussed. In Chapter V a new method of structure refinement - an alternative to the rietveld method, was proposed and applied to powder data of tungsten oxide .This method requires no apriori assumption regarding the functional nature of observed peaks .…

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This work deals maily with following areas of XRD line profile analysis: In chapter II methods of precise and accurate estimation of crystallographic parameters using statistical techniques such as maximum likelyhood method & Min-Max method, have been developed and applied to extract different crystallographic parameters. In Chapter III methods were developed to ascertain which analytical function can describe an experimentally observed XRD peak best. In chapter IV short-commings of Voigt & pseudo- Voigt functions when subjected to Warren Averbach and variance method of size-strain analysis ,were discussed. In Chapter V a new method of structure refinement - an alternative to the rietveld method, was proposed and applied to powder data of tungsten oxide .This method requires no apriori assumption regarding the functional nature of observed peaks .VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 164 pp. Englisch.…