Isbn: 9783319840413 - electromigration inside logic cells: modeling, analyzing and mitigating signal electromigration in nanocmos (14 resultados)

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Paperback or Softback. Condición: New. Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in Nanocmos. Book.

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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. …

Taschenbuch. Condición: Neu. Electromigration Inside Logic Cells | Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS | Gracieli Posser (u. a.) | Taschenbuch | xx | Englisch | 2018 | Springer | EAN 9783319840413 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics. 118 pp. Englisch.…

Condición: New. Print on Demand.

Condición: New. PRINT ON DEMAND.