Isbn: 9781528210102 - calculations for comparing two-point and four-point probe resistivity measurements on rectangular bar-shaped semiconductor samples (classic reprint) (3 resultados)

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Paperback. Condición: New. Print on Demand. This book provides in-depth guidance on calculating and comparing four- and two-point probe resistivity measurements in rectangular bar-shaped semiconductor samples. The four-point probe method is an established technique with several shortcomings in determining resistivity. Comparing it to the two-point probe method via correction factors allows scientists to calibrate four-point probe measuring apparatus and assess accuracy in various experimental conditions. The author provides Fortran code to calculate correction factors, enabling users to explore errors due to probe geometry, sample size, and non-uniform end plating. The book incorporates a thorough analysis of accuracy limitations and a discussion of the significance of maintaining precise sample and probe parameters. This book will be an invaluable resource for those in the field of semiconductor research and development, providing a comprehensive understanding of four-point probe resistivity measurements and their application in evaluating semiconductor materials. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.…