Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor Samples (Classic Reprint) - Tapa blanda
Sinopsis
Excerpt from Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor Samples
Fortran codes are given which enable the calculation of four-point probe correction factors for use with bar shaped samples. Samples with either plated or unplated ends are considered. The errors that arise due to probe misplacement, inaccurate sample size and shape, and non uniform end plating are also considered. Use of the re sults permits accurate comparison of two-point and four point probe resistivity measurements. The codes are in Fortran II language and were written for an ibm 7090 computer.
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Calculations for Comparing Two-Point and Four-Point Probe Resistivity
Impresión bajo demandaLibrería: Forgotten Books, London, Reino Unido
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Paperback. Condición: New. Print on Demand. This book provides in-depth guidance on calculating and comparing four- and two-point probe resistivity measurements in rectangular bar-shaped semiconductor samples. The four-point probe method is an established technique with several shortcomings in determining resistivity. Comparing it to the two-point probe method via correction factors allows scientists to calibrate four-point probe measuring apparatus and assess accuracy in various experimental conditions. The author provides Fortran code to calculate correction factors, enabling users to explore errors due to probe geometry, sample size, and non-uniform end plating. The book incorporates a thorough analysis of accuracy limitations and a discussion of the significance of maintaining precise sample and probe parameters. This book will be an invaluable resource for those in the field of semiconductor research and development, providing a comprehensive understanding of four-point probe resistivity measurements and their application in evaluating semiconductor materials. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Nº de ref. del artículo: 9781528210102_0
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Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor Samples (Classic Reprint)
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PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000. Nº de ref. del artículo: LX-9781528210102
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Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor Samples (Classic Reprint)
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
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PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000. Nº de ref. del artículo: LX-9781528210102
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Swartzendruber, L: Calculations for Comparing Two-Point and
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Condición: New. KlappentextrnrnExcerpt from Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor SamplesFortran codes are given which enable the calculation of four-point probe correc. Nº de ref. del artículo: 2149116262
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