Librería: Books From California, Simi Valley, CA, Estados Unidos de America
EUR 70,33
Cantidad disponible: 1 disponibles
Añadir al carritopaperback. Condición: Very Good. Cover and edges may have some wear.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 113,61
Cantidad disponible: 1 disponibles
Añadir al carritoCondición: As New. Unread book in perfect condition.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 117,61
Cantidad disponible: 1 disponibles
Añadir al carritoCondición: New.
Librería: California Books, Miami, FL, Estados Unidos de America
EUR 120,00
Cantidad disponible: Más de 20 disponibles
Añadir al carritoCondición: New.
Librería: Majestic Books, Hounslow, Reino Unido
EUR 116,58
Cantidad disponible: 3 disponibles
Añadir al carritoCondición: New.
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 113,07
Cantidad disponible: 8 disponibles
Añadir al carritoCondición: As New. Unread book in perfect condition.
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 114,00
Cantidad disponible: 8 disponibles
Añadir al carritoCondición: New.
Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 122,72
Cantidad disponible: Más de 20 disponibles
Añadir al carritoCondición: New. In.
Librería: THE SAINT BOOKSTORE, Southport, Reino Unido
EUR 114,01
Cantidad disponible: 1 disponibles
Añadir al carritoPaperback / softback. Condición: New. New copy - Usually dispatched within 4 working days.
Librería: Books Puddle, New York, NY, Estados Unidos de America
EUR 140,95
Cantidad disponible: 3 disponibles
Añadir al carritoCondición: New. 1st edition NO-PA16APR2015-KAP.
Librería: Biblios, Frankfurt am main, HESSE, Alemania
EUR 140,02
Cantidad disponible: 3 disponibles
Añadir al carritoCondición: New.
Librería: preigu, Osnabrück, Alemania
EUR 93,25
Cantidad disponible: 5 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. Handbook of Measurement Error Models | Grace Y. Yi (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2024 | Chapman and Hall/CRC | EAN 9781032070087 | Verantwortliche Person für die EU: Taylor & Francis Verlag GmbH, Kaufingerstr. 24, 80331 München, gpsr[at]taylorandfrancis[dot]com | Anbieter: preigu.
Librería: Revaluation Books, Exeter, Reino Unido
EUR 163,48
Cantidad disponible: 2 disponibles
Añadir al carritoPaperback. Condición: Brand New. 592 pages. 10.00x7.00x1.34 inches. In Stock.
Idioma: Inglés
Publicado por Chapman And Hall/CRC Jan 2024, 2024
ISBN 10: 1032070080 ISBN 13: 9781032070087
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 99,30
Cantidad disponible: 2 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Measurement error arises ubiquitously in applications and has been of long-standing concern in a variety of fields, including medical research, epidemiological studies, economics, environmental studies, and survey research. While several research monographs are available to summarize methods and strategies of handling different measurement error problems, research in this area continues to attract extensive attention. The Handbook of Measurement Error Models provides overviews of various topics on measurement error problems. It collects carefully edited chapters concerning issues of measurement error and evolving statistical methods, with a good balance of methodology and applications. It is prepared for readers who wish to start research and gain insights into challenges, methods, and applications related to error-prone data. It also serves as a reference text on statistical methods and applications pertinent to measurement error models, for researchers and data analysts alike. Features:Provides an account of past development and modern advancement concerning measurement error problemsHighlights the challenges induced by error-contaminated dataIntroduces off-the-shelf methods for mitigating deleterious impacts of measurement error Describes state-of-the-art strategies for conducting in-depth research 592 pp. Englisch.
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
EUR 124,68
Cantidad disponible: Más de 20 disponibles
Añadir al carritoPAP. Condición: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de America
EUR 131,56
Cantidad disponible: Más de 20 disponibles
Añadir al carritoPAP. Condición: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Librería: moluna, Greven, Alemania
EUR 91,74
Cantidad disponible: Más de 20 disponibles
Añadir al carritoCondición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Grace Y. Yi is Professor of Statistics at the University of Western Ontario where she holds a Tier I Canada Research Chair in Data Science. She is a Fellow of the Institute of Mathematical Statistics (IMS), a Fellow of the American Stati.
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 113,70
Cantidad disponible: 1 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Measurement error arises ubiquitously in applications and has been of long-standing concern in a variety of fields, including medical research, epidemiological studies, economics, environmental studies, and survey research. While several research monographs are available to summarize methods and strategies of handling different measurement error problems, research in this area continues to attract extensive attention. The Handbook of Measurement Error Models provides overviews of various topics on measurement error problems. It collects carefully edited chapters concerning issues of measurement error and evolving statistical methods, with a good balance of methodology and applications. It is prepared for readers who wish to start research and gain insights into challenges, methods, and applications related to error-prone data. It also serves as a reference text on statistical methods and applications pertinent to measurement error models, for researchers and data analysts alike. Features:Provides an account of past development and modern advancement concerning measurement error problemsHighlights the challenges induced by error-contaminated dataIntroduces off-the-shelf methods for mitigating deleterious impacts of measurement error Describes state-of-the-art strategies for conducting in-depth research.