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Librería: GreatBookPricesUK, Woodford Green, Reino Unido
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 263,82
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Idioma: Inglés
Publicado por Elsevier Science Publishing Co Inc, US, 2021
ISBN 10: 0128246073 ISBN 13: 9780128246078
Librería: Rarewaves.com USA, London, LONDO, Reino Unido
EUR 287,18
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Añadir al carritoHardback. Condición: New. Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
Idioma: Inglés
Publicado por Elsevier Science Publishing Co Inc, US, 2021
ISBN 10: 0128246073 ISBN 13: 9780128246078
Librería: Rarewaves.com UK, London, Reino Unido
EUR 270,54
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Añadir al carritoHardback. Condición: New. Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
Librería: Majestic Books, Hounslow, Reino Unido
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Librería: Books Puddle, New York, NY, Estados Unidos de America
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Añadir al carritoCondición: New. 1st edition NO-PA16APR2015-KAP.
Librería: Biblios, Frankfurt am main, HESSE, Alemania
EUR 216,94
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Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 231,45
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Idioma: Inglés
Publicado por Elsevier Science & Technology|Academic Press, 2021
ISBN 10: 0128246073 ISBN 13: 9780128246078
Librería: moluna, Greven, Alemania
EUR 255,65
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Añadir al carritoGebunden. Condición: New. Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical .
Librería: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 169,63
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Añadir al carritoCondición: new. Questo è un articolo print on demand.
Idioma: Inglés
Publicado por Elsevier Science & Technology, Academic Press, 2021
ISBN 10: 0128246073 ISBN 13: 9780128246078
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 175,00
Cantidad disponible: 2 disponibles
Añadir al carritoBuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. Englisch.
Librería: Revaluation Books, Exeter, Reino Unido
EUR 222,00
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Añadir al carritoHardcover. Condición: Brand New. 232 pages. 9.00x6.00x0.79 inches. In Stock. This item is printed on demand.
Idioma: Inglés
Publicado por Elsevier Science & Technology, Academic Press, 2021
ISBN 10: 0128246073 ISBN 13: 9780128246078
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 192,72
Cantidad disponible: 2 disponibles
Añadir al carritoBuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.