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SECONDARY ION MASS SPECTROMETRY: Fundamentals and Applications. Report on the Second Japan - United States Joint Seminar on SIMS
Someno, M. & Wittry, D. B.
Editorial: Riaru-Kogeisha, Ltd, Tokyo, 1979
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Librería: J. Wyatt Books, Ottawa, ON, CanadaJ. Wyatt Books
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Condición: Usado - Bueno
EUR 159,26
Envío por EUR 20,62
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Soft cover. Condición: Very Good. 326 pages in very good condition. Pages are clean and unmarked. Page edges are lightly smudged. Bound in blue wraps with black titles. Smudged and darkened around the edges. Wrinkled and darkened on the spine, torn on the tail. SCARCE. VG Size: 8 1/2 x 11. Book.