Publicado por John Wiley and Sons, 1968
Librería: BookDepart, Shepherdstown, WV, Estados Unidos de America
EUR 25,58
Cantidad disponible: 1 disponibles
Añadir al carritoHardcover. Condición: UsedGood. Hardcover; surplus library copy with the usual stampings; reference number written on front; fading and shelf wear to exterior; fading to pages; in good condition with clean text and tight binding. No dust jacket.
Idioma: Inglés
Publicado por Wiley, 1968
Librería: My Dead Aunt's Books, Hyattsville, MD, Estados Unidos de America
EUR 66,12
Cantidad disponible: 1 disponibles
Añadir al carritohardcover. Condición: Very Good. Estado de la sobrecubierta: Unclipped; fair. Presumed first ed.; 287 p., clean and unmarked anywhere on strong unaged paper; binding firm; clean unfaded gray boards have light rubbing at corners and at crown and foot of spine; glossy d.j. is chipped at corners and crown of spine panel.
Publicado por John Wiley & Sons, 1968
Librería: Roland Antiquariat UG haftungsbeschränkt, Weinheim, Alemania
EUR 30,10
Cantidad disponible: 1 disponibles
Añadir al carritoGebundene Ausgabe. o.A. 287 S. Lager- und Gebrauchsspuren. Kapital und Ecken bestoßen, Leinen gebunden. Ausgeschiedenes Bibliotheksexemplar mit den üblichen Kennzeichnungen. Die Leseseiten sind sauber und ohne Anstreichungen oder Knicke. Sprache: Englisch Gewicht in Gramm: 600.
Publicado por John Wiley & Sons, 1968
Librería: Pistil Books Online, IOBA, Seattle, WA, Estados Unidos de America
Miembro de asociación: IOBA
EUR 87,28
Cantidad disponible: 1 disponibles
Añadir al carritoHard Cover. Condición: Fine. Estado de la sobrecubierta: Good. Book is in excellent condition. Binding is solid and square, covers have sharp corners, exterior shows no blemishes, text/interior is clean and free of marking of any kind. Dust jacket is slightly worn. 276 pages, contents include: low injection diode characteristics, low injection transistor characteristics, nuclear radiation, displacemnt effects in silicon devices, Transient damage effects in silicn devices, Surface damage effects "."measurements for physical characteristics and equivalent circuit parameters. etc. Keywords: Low, Injection, Transistor, Characteristics, Nuclear, Radiation, Displacemnt, Silicon, Devices, Transient, Damage, Surface, Measurements, Physical, Equivalent, Circuit, Parameters.