Kurt hingerl (18 resultados)

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  • Idioma: Inglés

    Editorial: Springer, 2016

    3662519712 / 9783662519714

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    Condición: Nuevo

    EUR 333,33

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    Cantidad disponible: 15 disponibles

    Condición: New.

  • Idioma: Inglés

    Editorial: Springer, 2013

    3642339557 / 9783642339554

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    EUR 333,33

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    Cantidad disponible: 15 disponibles

    Condición: New.

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    Idioma: Inglés

    Editorial: Springer, 2016

    3662519712 / 9783662519714

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    Librería: preigu, Osnabrück, Alemaniapreigu

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    Condición: Nuevo

    EUR 274,65

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    Cantidad disponible: 5 disponibles

    Taschenbuch. Condición: Neu. Ellipsometry at the Nanoscale | Maria Losurdo (u. a.) | Taschenbuch | xxiv | Englisch | 2016 | Springer | EAN 9783662519714 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

  • Idioma: Inglés

    Editorial: Springer, 2016

    3662519712 / 9783662519714

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    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

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    Condición: Nuevo

    EUR 348,59

    Envío por EUR 17,61 
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    Cantidad disponible: Más de 20 disponibles

    Condición: New. In English.

  • Idioma: Inglés

    Editorial: Springer, 2013

    3642339557 / 9783642339554

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    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

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    Condición: Nuevo

    EUR 348,59

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    Cantidad disponible: Más de 20 disponibles

    Condición: New. In English.

  • Idioma: Inglés

    Editorial: Springer, 2016

    3662519712 / 9783662519714

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    Condición: Usado - Como Nuevo

    EUR 371,86

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    Cantidad disponible: 15 disponibles

    Condición: As New. Unread book in perfect condition.

  • Idioma: Inglés

    Editorial: Springer, 2013

    3642339557 / 9783642339554

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    Condición: Usado - Como Nuevo

    EUR 372,10

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    Cantidad disponible: 15 disponibles

    Condición: As New. Unread book in perfect condition.

  • Idioma: Inglés

    Editorial: Springer Vieweg, 2016

    3662519712 / 9783662519714

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    Condición: Nuevo

    EUR 338,77

    Envío por EUR 42,87 
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    Cantidad disponible: 1 disponible

    Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.…

  • Idioma: Inglés

    Editorial: Springer Gabler, 2013

    3642339557 / 9783642339554

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    Condición: Nuevo

    EUR 338,77

    Envío por EUR 44,00 
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    Cantidad disponible: 1 disponible

    Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.…

  • Idioma: Inglés

    Editorial: Springer Verlag, 2013

    3642339557 / 9783642339554

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    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

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    Condición: Nuevo

    EUR 472,45

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    Cantidad disponible: 2 disponibles

    Hardcover. Condición: Brand New. 2013 edition. 754 pages. French language. 9.25x6.25x1.75 inches. In Stock.

  • Idioma: Inglés

    Editorial: Springer, 2013

    3642339557 / 9783642339554

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    Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    Condición: Nuevo

    EUR 246,33

    Envío por EUR 11,00 
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    Cantidad disponible: Más de 20 disponibles

    Condición: new. Questo è un articolo print on demand.

  • Idioma: Inglés

    Editorial: Springer, 2016

    3662519712 / 9783662519714

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    Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    Condición: Nuevo

    EUR 246,33

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    Condición: new. Questo è un articolo print on demand.

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, 2013

    3642339557 / 9783642339554

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    Librería: moluna, Greven, Alemaniamoluna

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    Condición: Nuevo

    EUR 267,86

    Envío por EUR 48,99 
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    Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides different aspects and opinion on a rapidly evolving fieldReviews recent applications of polarimetric techniques to nanomaterialsWritten by renomed experts in the fieldProvides different aspects and opinion on a rapidly e.…

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, 2016

    3662519712 / 9783662519714

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    Librería: moluna, Greven, Alemaniamoluna

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    Condición: Nuevo

    EUR 267,86

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    Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides different aspects and opinion on a rapidly evolving fieldReviews recent applications of polarimetric techniques to nanomaterialsWritten by renomed experts in the fieldThis book presents and introduces ellipsometry in nanosc.…

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg Aug 2016, 2016

    3662519712 / 9783662519714

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    Condición: Nuevo

    EUR 320,99

    Envío por EUR 23,00 
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    Cantidad disponible: 2 disponibles

    Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications. 756 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg Mrz 2013, 2013

    3642339557 / 9783642339554

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    Condición: Nuevo

    EUR 320,99

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    Cantidad disponible: 2 disponibles

    Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications. 756 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, Springer Berlin Heidelberg Aug 2016, 2016

    3662519712 / 9783662519714

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    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

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    Condición: Nuevo

    EUR 320,99

    Envío por EUR 60,00 
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    Cantidad disponible: 1 disponible

    Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 756 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2013, 2013

    3642339557 / 9783642339554

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    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

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    Condición: Nuevo

    EUR 320,99

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    Cantidad disponible: 1 disponible

    Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 756 pp. Englisch.…