Publicado por Ukrainian Center for Independent Political Research (UCIPR)
Librería: Wonder Book, Frederick, MD, Estados Unidos de America
EUR 26,55
Cantidad disponible: 1 disponibles
Añadir al carritoCondición: Fair. Acceptable condition. (Ukraine, Politicians, Biography) A readable, intact copy that may have noticeable tears and wear to the spine. All pages of text are present, but they may include extensive notes and highlighting or be heavily stained. Includes reading copy only books.
Librería: Scissortail, Oklahoma City, OK, Estados Unidos de America
EUR 88,65
Cantidad disponible: 1 disponibles
Añadir al carritoCondición: good. This is a pre-loved book that shows moderate signs of wear from previous reading. You may notice creases, edge wear, or a cracked spine, but it remains in solid, readable condition.Please note:-May include library or rental stickers, stamps, or markings.-Supplemental materials e.g., CDs, access codes, inserts are not guaranteed.-Box sets may not come with the original outer box. If it does, the box will not be in perfect condition. -Sourced from donation centers; authenticity not verified with publisher. Your satisfaction is our top priority! If you have any questions or concerns about your order, please don't hesitate to reach out. Thank you for shopping with us and supporting small businessâ"happy reading!
Idioma: Inglés
Publicado por Woodhead Publishing Ltd 2014-06-25, 2014
ISBN 10: 0857095269 ISBN 13: 9780857095268
Librería: Chiron Media, Wallingford, Reino Unido
EUR 161,88
Cantidad disponible: Más de 20 disponibles
Añadir al carritoHardcover. Condición: New.
Idioma: Inglés
Publicado por Woodhead Publishing Limited, 2014
ISBN 10: 0857095269 ISBN 13: 9780857095268
Librería: Majestic Books, Hounslow, Reino Unido
EUR 182,93
Cantidad disponible: 3 disponibles
Añadir al carritoCondición: New. pp. 496.
Librería: Revaluation Books, Exeter, Reino Unido
EUR 184,39
Cantidad disponible: 2 disponibles
Añadir al carritoHardcover. Condición: Brand New. 1st edition. 496 pages. 9.75x6.75x1.50 inches. In Stock.
Idioma: Inglés
Publicado por Woodhead Publishing Limited, 2014
ISBN 10: 0857095269 ISBN 13: 9780857095268
Librería: Books Puddle, New York, NY, Estados Unidos de America
EUR 198,82
Cantidad disponible: 3 disponibles
Añadir al carritoCondición: New. pp. 496.
Idioma: Inglés
Publicado por Woodhead Publishing Limited, 2014
ISBN 10: 0857095269 ISBN 13: 9780857095268
Librería: Biblios, Frankfurt am main, HESSE, Alemania
EUR 203,66
Cantidad disponible: 3 disponibles
Añadir al carritoCondición: New. pp. 496.
Publicado por Minsk, 1978
Librería: BiblioEra, Everett, MA, Estados Unidos de America
EUR 176,43
Cantidad disponible: 1 disponibles
Añadir al carritoHardcover. Condición: Good. In Russian. Kononchuk, Aleksandr Yakovlevich. Quality of products and improvement of pricing. Minsk: Znanie JSC of the BSSR, 1978 All images are for identification of editions only. Several books of the same edition may be available. Please feel free to request photos of available books.SKU7633160.
Publicado por Minsk, 1975
Librería: BiblioEra, Everett, MA, Estados Unidos de America
EUR 176,43
Cantidad disponible: 1 disponibles
Añadir al carritoHardcover. Condición: Good. In Russian. Kononchuk, Alexander Yakovlevich. Product Quality and Pricing. Minsk: Science and Technology, 1975. All images are for identification of editions only. Several books of the same edition may be available. Please feel free to request photos of available books.SKU6987466.
Idioma: Chino
Publicado por National Defense Industry Press
ISBN 10: 711811636X ISBN 13: 9787118116366
Librería: liu xing, Nanjing, JS, China
EUR 141,26
Cantidad disponible: 1 disponibles
Añadir al carritoHardcover. Condición: New. HardCover. Pub Date: 2018-09-01 Pages: 385 Language: Chinese Publisher: National Defense Industry Press The Silicon On Insulator (SOI) Technology: Manufacturing and Applications is a comprehensive introduction to the advances in SOI CMOS technology. The book is divided into two parts: The first part introduces the manufacturing process. characterization and SO.
Publicado por LAP LAMBERT Academic Publishing Jan 2018, 2018
ISBN 10: 6136660881 ISBN 13: 9786136660882
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 21,70
Cantidad disponible: 2 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -V monografii kratko otrazheny osnovnye teorii, koncepcii i modeli samoubijstva, neodnoznachnost' terminov i ponimaniya suicidal'nogo povedeniya, izlozhen mehanizm formirovaniya i razvitiya suicidov. Zatronuty voprosy mirovoj statistiki suicidal'noj aktivnosti. Rassmotreny osnovnye diagnosticheskie kriterii suicidal'nogo riska u psihicheski zdorovyh lic, ishodya iz dinamicheskih pokazatelej izmeneniya urovnya psihicheskoj adaptacii i mezhpolusharnoj asimmetrii golovnogo mozga. V rabote predstavleny osnovnye polozheniya dvuhjetapnoj organizacionno-funkcional'noj modeli vyyavleniya suicidal'nogo riska i prakticheskie predlozheniya po profilaktike samoubijstv u voennosluzhashhih. Monografiya prednaznachena dlya rabotnikov medicinskoj sluzhby, grupp professional'no-psihologicheskogo otbora, dolzhnostnyh lic i specialistov voinskih chastej, psihologov, suicidologov. Diagnosticheskij podhod v vyyavlenii, model' vyyavleniya i preduprezhdeniya suicidal'nogo riska mogut byt' ispol'zovany psihologami i pedagogami obshheobrazovatel'nyh zavedenij, poskol'ku v rabote izlozheny korrelyacii pokazatelej suicidal'nogo riska i dinamicheskih pokazatelej izmeneniya psihicheskoj adaptacii u podrostkov. 80 pp. Russisch.
Idioma: Inglés
Publicado por Elsevier Science Jun 2014, 2014
ISBN 10: 0857095269 ISBN 13: 9780857095268
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 150,00
Cantidad disponible: 2 disponibles
Añadir al carritoBuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Silicon-On-Insulator (SOI) Technology: Manufacture and Applications covers SOI transistors and circuits, manufacture, and reliability. The book also looks at applications such as memory, power devices, and photonics. The book is divided into two parts; part one covers SOI materials and manufacture, while part two covers SOI devices and applications. The book begins with chapters that introduce techniques for manufacturing SOI wafer technology, the electrical properties of advanced SOI materials, and modeling short-channel SOI semiconductor transistors. Both partially depleted and fully depleted SOI technologies are considered. Chapters 6 and 7 concern junctionless and fin-on-oxide field effect transistors. The challenges of variability and electrostatic discharge in CMOS devices are also addressed. Part two covers recent and established technologies. These include SOI transistors for radio frequency applications, SOI CMOS circuits for ultralow-power applications, and improving device performance by using 3D integration of SOI integrated circuits. Finally, chapters 13 and 14 consider SOI technology for photonic integrated circuits and for micro-electromechanical systems and nano-electromechanical sensors. The extensive coverage provided by Silicon-On-Insulator (SOI) Technology makes the book a central resource for those working in the semiconductor industry, for circuit design engineers, and for academics. It is also important for electrical engineers in the automotive and consumer electronics sectors. 496 pp. Englisch.
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 156,09
Cantidad disponible: 2 disponibles
Añadir al carritoBuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Silicon-On-Insulator (SOI) Technology: Manufacture and Applications covers SOI transistors and circuits, manufacture, and reliability. The book also looks at applications such as memory, power devices, and photonics. The book is divided into two parts; part one covers SOI materials and manufacture, while part two covers SOI devices and applications. The book begins with chapters that introduce techniques for manufacturing SOI wafer technology, the electrical properties of advanced SOI materials, and modeling short-channel SOI semiconductor transistors. Both partially depleted and fully depleted SOI technologies are considered. Chapters 6 and 7 concern junctionless and fin-on-oxide field effect transistors. The challenges of variability and electrostatic discharge in CMOS devices are also addressed. Part two covers recent and established technologies. These include SOI transistors for radio frequency applications, SOI CMOS circuits for ultralow-power applications, and improving device performance by using 3D integration of SOI integrated circuits. Finally, chapters 13 and 14 consider SOI technology for photonic integrated circuits and for micro-electromechanical systems and nano-electromechanical sensors. The extensive coverage provided by Silicon-On-Insulator (SOI) Technology makes the book a central resource for those working in the semiconductor industry, for circuit design engineers, and for academics. It is also important for electrical engineers in the automotive and consumer electronics sectors.
Publicado por LAP LAMBERT Academic Publishing Jan 2018, 2018
ISBN 10: 6136660881 ISBN 13: 9786136660882
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
EUR 21,70
Cantidad disponible: 1 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -V monografii kratko otrazheny osnownye teorii, koncepcii i modeli samoubijstwa, neodnoznachnost' terminow i ponimaniq suicidal'nogo powedeniq, izlozhen mehanizm formirowaniq i razwitiq suicidow. Zatronuty woprosy mirowoj statistiki suicidal'noj aktiwnosti. Rassmotreny osnownye diagnosticheskie kriterii suicidal'nogo riska u psihicheski zdorowyh lic, ishodq iz dinamicheskih pokazatelej izmeneniq urownq psihicheskoj adaptacii i mezhpolusharnoj asimmetrii golownogo mozga. V rabote predstawleny osnownye polozheniq dwuhätapnoj organizacionno-funkcional'noj modeli wyqwleniq suicidal'nogo riska i prakticheskie predlozheniq po profilaktike samoubijstw u woennosluzhaschih. Monografiq prednaznachena dlq rabotnikow medicinskoj sluzhby, grupp professional'no-psihologicheskogo otbora, dolzhnostnyh lic i specialistow woinskih chastej, psihologow, suicidologow. Diagnosticheskij podhod w wyqwlenii, model' wyqwleniq i preduprezhdeniq suicidal'nogo riska mogut byt' ispol'zowany psihologami i pedagogami obscheobrazowatel'nyh zawedenij, poskol'ku w rabote izlozheny korrelqcii pokazatelej suicidal'nogo riska i dinamicheskih pokazatelej izmeneniq psihicheskoj adaptacii u podrostkow.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 80 pp. Russisch.
Publicado por LAP LAMBERT Academic Publishing
ISBN 10: 6136660881 ISBN 13: 9786136660882
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 24,08
Cantidad disponible: 1 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - V monografii kratko otrazheny osnovnye teorii, koncepcii i modeli samoubijstva, neodnoznachnost' terminov i ponimaniya suicidal'nogo povedeniya, izlozhen mehanizm formirovaniya i razvitiya suicidov. Zatronuty voprosy mirovoj statistiki suicidal'noj aktivnosti. Rassmotreny osnovnye diagnosticheskie kriterii suicidal'nogo riska u psihicheski zdorovyh lic, ishodya iz dinamicheskih pokazatelej izmeneniya urovnya psihicheskoj adaptacii i mezhpolusharnoj asimmetrii golovnogo mozga. V rabote predstavleny osnovnye polozheniya dvuhjetapnoj organizacionno-funkcional'noj modeli vyyavleniya suicidal'nogo riska i prakticheskie predlozheniya po profilaktike samoubijstv u voennosluzhashhih. Monografiya prednaznachena dlya rabotnikov medicinskoj sluzhby, grupp professional'no-psihologicheskogo otbora, dolzhnostnyh lic i specialistov voinskih chastej, psihologov, suicidologov. Diagnosticheskij podhod v vyyavlenii, model' vyyavleniya i preduprezhdeniya suicidal'nogo riska mogut byt' ispol'zovany psihologami i pedagogami obshheobrazovatel'nyh zavedenij, poskol'ku v rabote izlozheny korrelyacii pokazatelej suicidal'nogo riska i dinamicheskih pokazatelej izmeneniya psihicheskoj adaptacii u podrostkov.