Kawa jamil (25 resultados)

Hardcover. Condición: New. SHRINK-WRAPPED: US SELLER SHIPS FAST FROM USA.

Condición: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.

Condición: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.…

Condición: Good. : Este libro aborda el diseño para la fabricabilidad y el rendimiento de CMOS a nanoescala. Explora los desafíos y soluciones en el diseño de circuitos integrados a nanoescala, centrándose en la optimización para la fabricación y el rendimiento. Cubre temas como la variabilidad del proceso, la gestión de la energía y las técnicas de diseño para mejorar la fiabilidad y el rendimiento de los sistemas CMOS a nanoescala. EAN: 9781402051876 Tipo: Libros Categoría: Tecnología|Ciencias Título: Design for Manufacturability and Yield for Nano-Scale CMOS Autor: Charles Chiang| Jamil Kawa Editorial: Springer Idioma: eng Páginas: 253 Formato: tapa dura.…

Condición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Soft cover. Condición: New. US SELLER SHIPS FROM USA.

Condición: As New. Unread book in perfect condition.

Condición: As New. Unread book in perfect condition.

Condición: New.

Condición: New.

Condición: New.

Condición: New. In English.

Condición: As New. Unread book in perfect condition.

Condición: New. In English.

Condición: New. pp. 288.

Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development. 288 pp. Englisch.…

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development. 288 pp. Englisch.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Addressing a new topic (DFM/DFY) critical at 90 nm and beyondNo book available today with comprehensive coverage of this topicBook covers all CAD/CAE aspects of a SOC design flowDr. Charles Chiang is R&ampD Director of the Advanced. …

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Addressing a new topic (DFM/DFY) critical at 90 nm and beyondNo book available today with comprehensive coverage of this topicBook covers all CAD/CAE aspects of a SOC design flowDr. Charles Chiang is R&ampD Director of the Advanced. …

Condición: New. Print on Demand pp. 288 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

Condición: New. PRINT ON DEMAND pp. 288.