Idioma: Inglés
Publicado por VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2013
ISBN 10: 3659400599 ISBN 13: 9783659400599
Librería: Books Puddle, New York, NY, Estados Unidos de America
EUR 65,44
Cantidad disponible: 4 disponibles
Añadir al carritoCondición: New. pp. 72.
Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing, 2013
ISBN 10: 3659400599 ISBN 13: 9783659400599
Librería: preigu, Osnabrück, Alemania
EUR 36,35
Cantidad disponible: 5 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. Optical Feedback In Semiconductor Lasers | Applications To Measurements And Chaos Generation | Mohammad Taghi Fathi | Taschenbuch | 72 S. | Englisch | 2013 | LAP LAMBERT Academic Publishing | EAN 9783659400599 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.
Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing Jun 2013, 2013
ISBN 10: 3659400599 ISBN 13: 9783659400599
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 39,90
Cantidad disponible: 2 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The current book is a review of author research about nonlinear dynamics in optically injected semiconductor laser. a) A new method is introduced to measure the thickness and refractive index of transparent thin films by Self-mixing interferometry which is an important application of weak optical feedback in semiconductor lasers. b) The regimes of perturbation in a laser diode subjected to delayed optical feedback (DOF) from an external reflector is numerically analyzed from short to long cavity and from weak to strong optical feedback. 72 pp. Englisch.
Idioma: Inglés
Publicado por VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2013
ISBN 10: 3659400599 ISBN 13: 9783659400599
Librería: Majestic Books, Hounslow, Reino Unido
EUR 65,39
Cantidad disponible: 4 disponibles
Añadir al carritoCondición: New. Print on Demand pp. 72 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.
Idioma: Inglés
Publicado por VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2013
ISBN 10: 3659400599 ISBN 13: 9783659400599
Librería: Biblios, Frankfurt am main, HESSE, Alemania
EUR 65,78
Cantidad disponible: 4 disponibles
Añadir al carritoCondición: New. PRINT ON DEMAND pp. 72.
Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing Jun 2013, 2013
ISBN 10: 3659400599 ISBN 13: 9783659400599
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
EUR 39,90
Cantidad disponible: 1 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The current book is a review of author research about nonlinear dynamics in optically injected semiconductor laser. a) A new method is introduced to measure the thickness and refractive index of transparent thin films by Self-mixing interferometry which is an important application of weak optical feedback in semiconductor lasers. b) The regimes of perturbation in a laser diode subjected to delayed optical feedback (DOF) from an external reflector is numerically analyzed from short to long cavity and from weak to strong optical feedback.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 72 pp. Englisch.
Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing, 2013
ISBN 10: 3659400599 ISBN 13: 9783659400599
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 40,89
Cantidad disponible: 1 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The current book is a review of author research about nonlinear dynamics in optically injected semiconductor laser. a) A new method is introduced to measure the thickness and refractive index of transparent thin films by Self-mixing interferometry which is an important application of weak optical feedback in semiconductor lasers. b) The regimes of perturbation in a laser diode subjected to delayed optical feedback (DOF) from an external reflector is numerically analyzed from short to long cavity and from weak to strong optical feedback.