Ed s koob gary m (8 resultados)

Condición: New. This text presents a variety of specific approaches to achieving dependability at the application level. These approaches demonstrate how dependability may be tuned to the requirements of an application, the fault environment, and the characteristics of the target platform. Editor(s): Koob, Gary M.; Lau, Clifford. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 214 pages, biography. BIC Classification: UN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 235 x 155 x 14. Weight in Grams: 509. . 1994. Hardback. . . . . …

Condición: New. Editor(s): Van Tilborg, Andre M.; Koob, Gary M. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 316 pages, biography. BIC Classification: UN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 19. Weight in Grams: 1420. . 1991. Hardback. . . . .…

Condición: New. Editor(s): Van Tilborg, Andre M.; Koob, Gary M. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 326 pages, biography. BIC Classification: UN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 235 x 155 x 20. Weight in Grams: 653. . 1991. Hardback. . . . .…

Condición: New. This text explores the system infrastructure needed to support various paradigms. Approaches to implementing support mechanisms and to incorporating additional appropriate levels of fault detection and fault tolerance at the processor, network, and operating-system level are presented. Editor(s): Koob, Gary M.; Lau, Clifford. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 321 pages, biography. BIC Classification: UN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 20. Weight in Grams: 653. . 1994. Hardback. . . . .…

Condición: New. This text presents a variety of specific approaches to achieving dependability at the application level. These approaches demonstrate how dependability may be tuned to the requirements of an application, the fault environment, and the characteristics of the target platform. Editor(s): Koob, Gary M.; Lau, Clifford. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 214 pages, biography. BIC Classification: UN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 235 x 155 x 14. Weight in Grams: 509. . 1994. Hardback. . . . . Books ship from the US and Ireland. …

Condición: New. Editor(s): Van Tilborg, Andre M.; Koob, Gary M. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 316 pages, biography. BIC Classification: UN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 19. Weight in Grams: 1420. . 1991. Hardback. . . . . Books ship from the US and Ireland.…

Condición: New. This text explores the system infrastructure needed to support various paradigms. Approaches to implementing support mechanisms and to incorporating additional appropriate levels of fault detection and fault tolerance at the processor, network, and operating-system level are presented. Editor(s): Koob, Gary M.; Lau, Clifford. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 321 pages, biography. BIC Classification: UN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 20. Weight in Grams: 653. . 1994. Hardback. . . . . Books ship from the US and Ireland.…

Condición: New. Editor(s): Van Tilborg, Andre M.; Koob, Gary M. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 326 pages, biography. BIC Classification: UN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 235 x 155 x 20. Weight in Grams: 653. . 1991. Hardback. . . . . Books ship from the US and Ireland.…