Reliability Prediction for Microelectronics (Hardcover)

Idioma: inglés

Editorial: John Wiley & Sons Inc, New York, 2024

1394210930 / 9781394210930

Librería: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller

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Descripción del artículo del vendedor

Hardcover. RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the physics of failure, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.…

N° de ref. del artículo 9781394210930

Título
Reliability Prediction for Microelectronics (Hardcover)
Autor
Joseph B. Bernstein
Editorial
John Wiley & Sons Inc, New York
Año de publicación
2024
Estado
new
Encuadernación
Hardcover
Idioma
inglés
ISBN 10
1394210930
ISBN 13
9781394210930

AussieBookSeller

Truganina, VIC, Australia

Vendedor de 5 estrellas

Vendedor de IberLibro desde 22 de junio de 2007

Tarifas de envío de Australia a Estados Unidos de America

ArtículoDe 25 a 45 días hábilesDe 8 a 14 días hábiles
Primer artículoEUR 33,16EUR 39,43
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The Nile Group Pty Ltd

42 Apex Drive
Truganina, VIC Australia 3029