Based on qualitative and quantitative insight, this volume presents the technological, physical, and mathematical fundamentals for a design paradigm shift for microelectronic circuits. The text explores design flow variations to establish different variants while optimizing the overall design. Editor(s): Dietrich, Manfred; Haase, Joachim. Num Pages: 252 pages, 32 black & white tables, biography. BIC Classification: TJFC; UGC. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 18. Weight in Grams: 567. . 2011. 2012. Hardback. . . . .

N� de ref. del art�culo V9781441966209

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Detalles bibliogr�ficos

T�tulo: Process Variations and Probabilistic Integrated Circuit Design
Editor: Springer-Verlag New York Inc.
Fecha de publicaci�n: 2011
Idioma: Ingl�s
ISBN 10: 144196620X
ISBN 13: 9781441966209
Encuadernaci�n: Encuadernaci�n de tapa dura
Estado: New

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Sinopsis

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

De la contraportada

Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.

This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process;
Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design;
Describes critical effects of process variation using simple examples that can be reproduced by the reader.

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