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Sinopsis
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
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Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.
This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
- Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process;
- Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design;
- Describes critical effects of process variation using simple examples that can be reproduced by the reader.
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Process Variations and Probabilistic Integrated Circuit Design.
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New York, Springer., 2012
ISBN 10: 144196620X
ISBN 13: 9781441966209
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Process Variations and Probabilistic Integrated Circuit Design
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process Offers both qualitative and quantitative insight into critical effects . Nº de ref. del artículo: 4176116
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Process Variations and Probabilistic Integrated Circuit Design
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Springer New York, Springer US Nov 2011, 2011
ISBN 10: 144196620X
ISBN 13: 9781441966209
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. 268 pp. Englisch. Nº de ref. del artículo: 9781441966209
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Process Variations and Probabilistic Integrated Circuit Design
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Springer New York, Springer US, 2011
ISBN 10: 144196620X
ISBN 13: 9781441966209
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Librería: AHA-BUCH GmbH, Einbeck, Alemania
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. Nº de ref. del artículo: 9781441966209
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Process Variations and Probabilistic Integrated Circuit Design (eng)
Impresión bajo demandaLibrería: Brook Bookstore On Demand, Napoli, NA, Italia
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Condición: new. Questo è un articolo print on demand. Nº de ref. del artículo: 255f89863cbc5589ef6ed1a5a667a76d
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Process Variations and Probabilistic Integrated Circuit Design
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Springer New York, Springer US Nov 2011, 2011
ISBN 10: 144196620X
ISBN 13: 9781441966209
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Neuware -Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 268 pp. Englisch. Nº de ref. del artículo: 9781441966209
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Process Variations and Probabilistic Integrated Circuit Design
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Process Variations and Probabilistic Integrated Circuit Design
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Hardcover. Condición: Brand New. 2012 edition. 265 pages. 9.00x6.25x0.75 inches. In Stock. Nº de ref. del artículo: x-144196620X
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Process Variations and Probabilistic Integrated Circuit Design
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Process Variations and Probabilistic Integrated Circuit Design
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Springer-Verlag New York Inc., 2011
ISBN 10: 144196620X
ISBN 13: 9781441966209
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Librería: THE SAINT BOOKSTORE, Southport, Reino Unido
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Hardback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 597. Nº de ref. del artículo: C9781441966209
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