Process Variations and Probabilistic Integrated Circuit Design - Tapa dura

 
9781441966209: Process Variations and Probabilistic Integrated Circuit Design
Tapa dura
ISBN 10: 144196620X ISBN 13: 9781441966209
Editorial: Springer, 2011

Sinopsis

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

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De la contraportada

Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.

This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

  • Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process;
  • Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design;
  • Describes critical effects of process variation using simple examples that can be reproduced by the reader.


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Editorial
Springer
Año de publicación
2011
Idioma
Inglés
ISBN 10 
144196620X
ISBN 13 
9781441966209
Encuadernación
Tapa dura
Número de páginas
268
Editor
Haase Joachim, Dietrich Manfred
Contacto del fabricante
no disponible
Persona responsable
CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
Alemania

Otras ediciones populares con el mismo título

9781489988607: Process Variations and Probabilistic Integrated Circuit Design

Edición Destacada

ISBN 10:  1489988602 ISBN 13:  9781489988607
Editorial: Springer, 2014
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