Nanometer-Scale Defect Detection Using Polarized Light

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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Num Pages: 316 pages, black & white illustrations. BIC Classification: TBN; TGMT; TTB. Category: (P) Professional & Vocational. Dimension: 242 x 164 x 22. Weight in Grams: 622. . 2016. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland. N° de ref. del artículo V9781848219366

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Pierre Richard Dahoo is Professor at the University of Versailles Saint-Quentin in France. His research interests include absorption spectroscopy, laser-induced fluorescence, ellipsometry, optical molecules, industrial materials, modeling and simulation. He is program manager of the Chair Materials Simulation and Engineering of UVSQ.

Philippe Pougnet is a Doctor in Engineering. He is an expert in reliability and product-process technology at Valeo and is currently working for the Vedecom Institute in Versailles, France. He is in charge of assessing the reliability of innovative power electronic systems.

Abdelkhalak El Hami is Professor at the Institut National des Sciences Appliquées (INSA-Rouen) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics, as well as several European pedagogical projects.