Knowledge-Driven Board-Level Functional Fault Diagnosis. Este artículo no está disponible.
Idioma: inglés
Editorial: Springer, 2018
- Tapa blanda
- Nuevo

Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
Vendedor de IberLibro desde 25 de marzo de 2015
Condición: Nuevo
EUR 97,04
Descripción del artículo del vendedor
In English.
N° de ref. del artículo ria9783319820545_new
- Título
- Knowledge-Driven Board-Level Functional Fault Diagnosis
- Autor
- Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
- Editorial
- Springer
- Año de publicación
- 2018
- Estado
- New
- Encuadernación
- Encuadernación de tapa blanda
- Idioma
- inglés
- ISBN 10
- 3319820540
- ISBN 13
- 9783319820545
- Peso del artículo
- 360 gramos
“Sinopsis” puede pertenecer a otra edición de este título.
Acerca del autor
Fangming Ye is a Staff Engineer at Huawei Technologies, with particular research interests in machine learning, data mining, resilient system design, and diagnosis system for board-level faults.
Zhaobo Zhang is a Staff Engineer at Huawei Technologies, specializing in Data analysis and machine learning, Network reliability, Application design, Flow standardization, diagnosis automation, and memory test.
Krishnendu Chakrabarty is the William H. Younger Distinguished Professor of Engineering in the Department of Electrical and Computer Engineering and Professor of Computer Science at Duke University. He is a recipient of the National Science Foundation Early Faculty (CAREER) award, the Office of Naval Research Young Investigator award, the Humboldt Research Award from the Alexander von Humboldt Foundation, Germany, the IEEE Transactions on CAD Donald O. Pederson Best Paper award (2015), and 11 best paper awards at major IEEE conferences. Heis also a recipient of the IEEE Computer Society Technical Achievement Award (2015) and the Distinguished Alumnus Award from the Indian Institute of Technology, Kharagpur (2014). Prof. Chakrabarty is a Hans Fischer Senior Fellow at the Institute for Advanced Studies, Technical University of Munich, Germany.
Prof. Chakrabarty’s current research projects include: testing and design-for-testability of integrated circuits and system; digital microfluidics, biochips, and cyberphysical systems; optimization of enterprise systems and smart manufacturing. He is a Fellow of ACM, a Fellow of IEEE, and a Golden Core Member of the IEEE Computer Society. Prof. Chakrabarty served as the Editor-in-Chief of IEEE Design & Test of Computers during 2010-2012 and ACM Journal on Emerging Technologies in Computing Systems during 2010-2015. Currently he serves as the Editor-in-Chief of IEEE Transactions on VLSI Systems.
Xinli Gu is a Senior Director at Huawei Technologies, where he leads design solution for network product quality and reliability. He also had 12-year experiences with Cisco Systems, responsible for product testability and manufacturing quality at corporate level.
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