Digital Circuit Testing: A Guide to Dft, Atvg, and Other Techniques

Wang, Francis C.

ISBN 10: 0127345809 ISBN 13: 9780127345802

Editorial: Academic Press, St Louis, Missouri, U.S.A., 1991

Idioma: Ingl�s

Condici�n: Usado - Excelente Encuadernaci�n de tapa dura

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Descripci�n

Has "Book Production Reprint Library" stamped on top edge, else fine. Size: 8vo - over 7�" - 9�" tall.

N� de ref. del art�culo 021840

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Detalles bibliogr�ficos

T�tulo

Digital Circuit Testing: A Guide to Dft, Atvg, and Other Techniques

Editor

Academic Press, St Louis, Missouri, U.S.A.

Fecha de publicaci�n

1991

Idioma

Ingl�s

ISBN 10

0127345809

ISBN 13

9780127345802

Encuadernaci�n

Hardcover

Edici�n

First Edition.

Estado

Fine

Estado de la sobrecubierta

No Jacket

Cat�logos de vendedores

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Sinopsis

Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Cr�ticas

"The text, Digital Circuit Testing: A Guide to DFT and Other Techniques, introduces the reader to the whole spectrum of digital test technology, covering some facets in more detail than others....This book is intended to be an introduction to straight-forward testing techniques, easily applicable to the daily work of design and test engineers or as a course or reference text. The author accomplishes his purpose succinctly and in an easy-to-understand style."
--IEEE, INSTRUMENTATION AND MEASUREMENT SOCIETY NEWSLETTER

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